Корреляционный нелинейно-оптический фемтосекундный лазерный профилометр с микрометровым пространственным разрешением

Abstract

For improving the measurement accuracy of the profile of surface irregularities at a distance of 1 km a new femtosecond correlation nonlinear optical profiler with a micron spatial resolution is offered. In the proposed profilometer at first the distance to the object to be scanned by measuring the interval between the sequences of the reference (probing) and reflected femtosecond laser pulses is determined. Then the profile of the rough surface by measuring the one-dimensional spatial distribution of the second harmonic radiation when performing the space-time alignment of the probe and reflected pulse sequences in a nonlinear crystal is restored. It is shown that the spatial resolution of the profilometer is not more than 5 microns.