Paper describes the structure, principle of work and metrological characteristics of the State primary standard of ellipsometric angles units GET 186-2017, which provides measurement of the two-dimensional spatial distribution of ellipsometric angles. The GET 186-2017 includes a spectral ellipsometer equipped with a two-coordinate table for measurements on a grid of 10×10 points, and an interference profilometer which measures a two-dimensional map of deviations from 90° normal to the surface of the object. At scan points where the normal deviation exceeds 0.01° there are no measurements. Measurement of the two-dimensional spatial distribution of ellipsometric angles allows restoring the spatial distribution of the thickness and complex refractive index of coatings over the area. GET 186-2017 ensures the uniformity of measurements in priority areas of science and technology, such as microelectronics, optics, instrument making. The main consumers of GET 186-2017 are organizations involved in the development of new products of microelectronics, solar cells, optics, in particular laser gyroscopes. Such products includes ordered multilayer structures deposited on substrates, which are controlled using various types of ellipsometers, including image ellipsometers.

The results of development of the national primary standard of air kerma, air kerma rate, exposure, exposure rate and energy flux for X-rays and gamma radiation GET 8-2011 in 2019 are presented according to the recommendations of the ICRU Report No. 90 “Key Data for Ionizing-Radiation Dosimetry: Measurement Standards and Applications”. The following changes are made to the equations for the units determination with the standard: in the field of X-rays, new correction coefficients of the free-air ionization chambers are introduced and the relative standard uncertainty of the average energy to create an ion pair in air is changed; in the field of gamma radiation, the product of the average energy to create an ion pair in air and the electron stopping-power graphite to air ratio for the cavity ionization chambers is changed. More accurate values of the units reproduced by GET 8-2019 are obtained and new metrological characteristics of the standard are stated.

Possibilities of the Periodic Table exploration are considered. It is shown that the four-valued logic of quantum measurements may be used for the classification of chemical elements. The application of the quantum scales with information on the position of chemical elements with the known sequence numbers inside them allows to find the new aims for metrological investigations and to develop new approaches in the quantum metrology.

Russian version of the ISO 25178-2:2012 standard is commented. The functions provided by the standard for calculating fractal dimension are considered, and the algorithms for calculating them in the Mathcad environment are described. An example of calculations based on the results of measurements of the height of the surface irregularities of the gauge block obtained using an atomic force microscope is given.

Recent active development of quantum computers and quantum key distribution systems requires characterization of the parameters of single-photon detectors. A key parameter of single-photon detectors is detection efficiency. One of the methods for measuring the detection efficiency given in the international ETSI standard is the Klyshko reference-free method based on the use of the effect of spontaneous parametric downconversion. The signal-to-noise ratio (SNR) of this method depends on a combination of the pump wavelength, the nonlinear crystal axis angle, and the type of detector sensitive element. When the combination is complex, one has to deal with low SNR. In this case, to obtain a high SNR, long-term signal accumulation is necessary. In real detectors, the situation is complicated by the presence of a high noise level at low frequencies. The heterodyning-based method we have proposed consists in introducing modulation into the standard Klyshko scheme and accumulating the signal at a higher frequency. The method was numerically modeled and experimentally tested. A 14 times improvement in SNR was demonstrated compared to simple signal accumulation.

The article discusses the difficulties that arise when measuring the speed parameters of modern broadband photodetector devices by a method based on the measurement results of the rise time of the transition characteristic are considered. As a solution of the described problems a method is proposed for quantitatively evaluating of speed parameters using the results of determining the impulse response of the studied photodetector. The source of the test signals is a pulsed fiber laser operating in the self-mode locking mode and generating ultrashort (about 3 ps) optical pulses. The article describes in detail the method itself, the measuring setup that allows it to be implemented, and presents some results of experimental testing of the method.

It is shown that the issues of metrological traceability for extended self-luminous objects with a wide range of brightness have not yet been resolved, since the rank scales of embedded systems are used for processing digital images. For such scales, there is no “fixed” unit, which does not allow you to get reliable results and ensure the unity of measurements. An experiment is described to evaluate the accuracy of determining the intensity (coordinates) of the color of self-luminous objects. In terms of repeatability and intermediate precision compared to the reference measurement method, the color and chromaticity coordinates of self-luminous objects (reference samples) were determined by their multiple digital registration using technical vision systems. The possibilities of the developed methodology for colorimetric studies in hardware and software environments from the point of view of constructing a multidimensional conditional scale are determined.

One of the most important diagnostic problems multilayer dielectric materials and coatings is the development of methods for quantitative interpretation of the checkout results their electrophysical and geometric parameters. The results of a study of the potential informativeness of the multi-frequency radio wave method of surface electromagnetic waves during reconstruction of the electrophysical and geometric parameters of multilayer dielectric coatings are presented. The simulation model is presented that makes it possible to evaluate of the accuracy of reconstruction of the electrophysical and geometric parameters of multilayer dielectric coatings. The model takes into account the values of the electrophysical and geometric parameters of the coating, the noise level in the measurement data and the measurement bandwidth. The results of simulation and experimental investigations of reconstruction of the structure of relative permittivitties and thicknesses of single-layer and double-layer dielectric coatings with different thicknesses, with different values of the standard deviation (RMS) of the noise level in the measured attenuation coefficients of the surface slow electromagnetic wave are presented. Coatings based on the following materials were investigated: polymethyl methacrylate, F-4D PTFE, RO3010. The accuracy of reconstruction of the electrophysical parameters of the layers decreases with an increase in the number of evaluated parameters and an increase in the noise level. The accuracy of the estimates of the electrophysical parameters of the layers also decreases with a decrease in their relative permittivity and thickness. The results of experimental studies confirm the adequacy of the developed simulation model. The presented model allows for a specific measuring complex that implements the multi-frequency radio wave method of surface electromagnetic waves, to quantify the potential possibilities for the accuracy of reconstruction of the electrophysical and geometric parameters of multilayer dielectric materials and coatings. Experimental investigations and simulation results of a multilayer dielectric coating demonstrated the theoretical capabilities gained relative error permittivity and thickness of the individual layers with relative error not greater than 10 %, with a measurement bandwidth of 1 GHz and RMS of noise level 0,003–0,004.

Spectral, dosimetric properties and metrological characteristics of different radiation sensitive compositions have been investigated for the radiation absorbed dose measurement instrumentation development purpose. It is shown possibility for absorbed dose measurements dynamical range expansion and uncertainty reduction for those compositions. These results can be used for routine dosimetric process control and metrological support in food stuff, agricultural commodities radiation processing technologies.

The problem of methods preparation for assessing the impact of metrology on the economy and society is considered. An overview of domestic and foreign publications and statistics on the issue is presented. The results of the development and testing the method for assessing the impact of metrology on the economy are adduced. The represented method is based on the estimation of the share in the added value of metrology costs both at the country level and at the level of separate economic activities. The comparability of the results of testing the method with the indicators obtained earlier by domestic and foreign specialists is shown.