Метрологический анализ оптико-электронных систем контроля профилограмм оболочек вращения

Abstract

Metrological analysis of opto-electronic systems for monitoring profilograms of shells of revolution was carried out. Optoelectronic systems, realizing various methods of searching for the center of details, are investigated. A mathematical model of the shell of revolution, defined by a profilogram, is considered. Based on the simulation results, the dependence of the absolute methodical error on how to do this is obtained.