|Generate QR code
Open Access
Subscription Access
Quantum Standard for Synthesis AC Voltage
https://doi.org/10.32446/0368-1025it.2020-4-39-43
Abstract
Prototype of quantum standard based on the Josephson effect for synthesis sine wave with low level harmonics and high accuracy was developed at VNIIM, which opens up new possibilities for metrological support in the field of АС voltage. The standard includes cryogenic probe with Josephson chips, delta-sigma modulator, pulse pattern generator, compensation circuit, spectrum analyzer, video control unit and software. The capability of synthesis sine wave with an output voltage up to 130 mV RMS over a wide frequency range from about 1 kHz to 100 kHz is shown. Higher harmonics are suppressed bellow the noise floor up to 100 dBc.
About the Authors
A. S. Katkov
D. I. Mendeleyev Institute for Metrology
Russian Federation
Russian Federation
Alexander S. Katkov
St. Petersburg
V. E. Lovtsyus
D. I. Mendeleyev Institute for Metrology
Russian Federation
Russian Federation
Viktor E. Lovtsyus
St. Petersburg
A. I. Bykov
D. I. Mendeleyev Institute for Metrology
Russian Federation
Russian Federation
Andrey I. Bykov
St. Petersburg
V. I. Shevtsov
D. I. Mendeleyev Institute for Metrology
Russian Federation
Russian Federation
Vladimir I. Shevtsov
St. Petersburg
A. N. Petrovskaya
D. I. Mendeleyev Institute for Metrology
Russian Federation
Russian Federation
Anastasia N. Petrovskaya
St. Petersburg
R. Behr
Physikalisch-Technische Bundesanstalt PTB
Germany
Germany
Ralf Behr
Braunschweig
O. Kieler
Physikalisch-Technische Bundesanstalt PTB
Germany
Germany
Oliver F. Kieler
Braunschweig
References
1. Aleksandrov V. S., Katkov A. S., Telitchenko G. P., Measurement Techniques, 2002, vol. 45, no. 3, pp. 228–232. DOI:10.1023/A:1015954501462
2. Behr R., Katkov A. S., Metrologia. Technical Supplement, 2005, vol. 42, p. 01005. DOI:10.1088/0026-1394/42/1A/01005
3. Katkov A., Solve S., Measurement Techniques, 2012, vol. 54, no. 11, pp. 1313–1318. DOI:10.1007/s11018-012-9873-6
4. Behr R., Schulze H., Müller F., Kohlmann J., Niemeyer J., IEEE Trans. Instrum. Meas., 1999, vol. 48, no. 2, pp. 270–273.
5. Lloyd F. L., Hamilton C. A., Beall J. A., Diane Go, Ono R. H., and Harris R. E., IEEE Electron Device Letters, 1987, vol. 8, no. 10, pp. 449–450. DOI:10.1109/EDL.1987.26690
6. Katkov A. S., Lovtsyus V. E., Bykov A. I., Shevtsov V. I., Novoderezhkin G.V., Measurement Techniques, 2017, vol. 60, no.6, pp. 589–593. DOI:10.1007/s11018-017-1240-1
7. Burroughs C. J., Dresselhaus P. D., Rüfenacht A., Elsbury M. M., and Benz S.P., CPEM Digest, Conference on Precision Electromagnetic Measurements, June 13–18, 2010, Daejeon Convention Center, Daejeon, Korea. DOI:10.1109/CPEM.2010.5544234
8. Mueller F., Behr R., Weimann T., Palafox L., Olaya D., Dresselhaus P. D., Benz S. P., IEEE Transactions on Applied Superconductivity, 2009, vol. 19, no. 3, pp. 981–986. DOI:10.1109/TASC.2009.2017911
9. Benz S. P., Dresselhaus P. D., Rüfenacht A., Bergren N. F., Kinard J. R., Landim R. P., IEEE Transactions on Instrumentation and Measurement, 2009, vol. 58, no. 4, pp. 838–843. DOI: 10.1109/CPEM.2008.4574646
10. Kieler O. F., Iuzzolino R., Kohlmann J., IEEE Transactions on Applied Superconductivity, 2009, vol. 19, no. 3, pp. 230–233. DOI:10.1109/TASC.2009.2019283
11. Flowers-Jacobs N. E., Rüfenacht A., Fox A. E., Dresselhaus P. D., and Benz S. P., CPEM Digest, Conference on Precision Electromagnetic Measurements (CPEM 2016), Ottawa, ON, 2016, pp. 1–2. DOI:10.1109/CPEM.2016.7540601
12. Schreier R., Temes G., Understanding Delta-Sigma Data Converters, Pisctaway, New Jersey, IEEE Press, 2005.
13. Candy J., IEEE Transactions on Communications, January 1986, vol. 34, no. 1, pp. 72–76. DOI:10.1109/TCOM.1986.1096432
14. Benz S. P., Burroughs C. J., Dresselhaus, P. D., IEEE Transactions on Applied Superconductivity, 2001, vol. 11, no. 1, pp. 612–616. DOI:10.1109/77.919419
Review
For citations:
Katkov A.S., Lovtsyus V.E., Bykov A.I., Shevtsov V.I., Petrovskaya A.N., Behr R., Kieler O. Quantum Standard for Synthesis AC Voltage. Izmeritel`naya Tekhnika. 2020;(4):39-43. (In Russ.) https://doi.org/10.32446/0368-1025it.2020-4-39-43
Views:
81
Email this article 