

Measurement of phase modulation of LCOS SLM Santec SLM-200 and analysis of its applicability for optical reconstruction of images from diffractive elements
https://doi.org/10.32446/0368-1025it.2021-5-4-8
Abstract
Phase liquid crystal (LC) spatial light modulators (SLM) are widely used for optical reconstruction of diffraction optical elements, including holograms. For this purpose high stability and linearity of phase response of SLM is required. In modern high resolution SLM digital signal addressing scheme which leads to emergence of effect of phase shift fluctuations during frame time is applied. In this paper measurements of character and peculiarities of modulation of phase shift of modern high-resolution LC SLM Santec SLM-200 were performed. Optical reconstruction of images from diffraction elements of different types was carried out, the quality of reconstruction and diffraction efficiency were assessed.
About the Authors
N. N. EvtikhievNational Research Nuclear University MEPhI (Moscow Engineering Physics Institute)
Russian Federation
Nickolay N. Evtikhiev
Moscow
V. V. Krasnov
Russian Federation
Vitaly V. Krasnov
Moscow
I. P. Ryabcev
National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)
Russian Federation
Ilya P. Ryabcev
Moscow
V. G. Rodin
Russian Federation
Vladislav G. Rodin
Moscow
R. S. Starikov
National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)
Russian Federation
Rostislav S. Starikov
Moscow
P. A. Cheremkhin
Russian Federation
Pavel A. Cheremkhin
Moscow
References
1. Lalor M. J., Diff ractive Optics for Industrial and Commercial Applications, ed. Turunen J., Wyrowski F., Berlin, Akademie Verlag, 1997, 426 p.
2. Wu S. T., Yang D. K., Refl ective Liquid Crystal Displays, ed. Wu S. T., Chichester, John Wiley and Sons Inc., 2005, 335 p.
3. Kotova S. P., Maiorova A. M., Samagin S. A., Optics and Spectroscopy. 2019, vol. 126, no 1, pp. 10–15. https://doi.org/10.1134/S0030400X19010089
4. Schnars U., Jueptner W., Digital holography: Digital hologram recording, numerical reconstruction, and related techniques, Berlin-Heidelberg, Springer-Verlag, 2005, 164 p.
5. Zwick S., Haist T., Warber M., Osten W., Appl. Opt., 2010, vol. 49, no. 25, pp. F47–F58. https://doi.org/10.1364/AO.49.000F47
6. Evtikhiev N. N., Starikov S. N., Cheryomkhin P. A., Krasnov V. V., Rodin V. G., Proc. SPIE, 2012, vol. 8429, pp. 84291M. https://doi.org/10.1117/12.922612
7. Hermerschmidt A., Osten S., Krüger S., Blümel T., Proc. SPIE, 2007, vol. 6584, p. 65840E. https://doi.org/10.1007/b138284
8. Bondareva A. P., Evtikhiev N. N., Krasnov V. V., Starikov S. N., Radiophys. Quantum Electron. 2015, vol. 57, no. 8-9, pp. 619–626. https://doi.org/10.1007/s11141-015-9547-8
9. Javidi B., Carnicer A., Yamaguchi M., J. Opt., 2016, vol. 18, pp. 083001. https://doi.org/10.1088/2040-8978/18/8/083001
10. Dou S., Shen X., Zhou B., Wang L., Lin C., Opt. Laser Technol., 2019, vol. 112, pp. 56–64. https://doi.org/10.1016/j.optlastec.2018.11.004
11. Peng X., Zhang P., Cai L., Proc. SPIE, 2004, vol. 115, pp. 420–426. https://doi.org/10.1117/12.571875
12. Cheremkhin P. A., Evtikhiev N. N., Krasnov V. V. et al., Laser Phys. Lett., 2020, vol. 17, pp. 025204. https://doi.org/10.1088/1612-202X/ab644c
13. Jaramillo-Osorio A., Barrera-Ramírez J. F., Mira-Agudelo A. et al., J. Opt., 2020, vol. 22, pp. 035702. https://doi.org/10.1134/S0030400X19100230
14. Ruchka P. A., Verenikina N. M., Gritsenko I. V. et al., Opt. Spectrosc., 2019, vol. 127, no. 4, pp. 563–569. https://doi.org/10.1134/S0030400X19100230
15. Cheremkhin P. A., Evtikhiev N. N., Krasnov V. V. et. al., Proc. SPIE, 2014, vol. 9006, pp. 900615. https://doi.org/10.1117/12.2037569
16. Goncharov D. S., Krasnov V. V., Ponomarev N. M., Starikov R. S., Proc. SPIE, 2018, vol. 10558, pp. 105580Y. https://doi.org/10.1117/12.2290043
17. Pnev A. B., Borisova A. V., Denisova Y. A. et al., Measurement Techniques, 2018, vol. 6 1, no. 5, pp. 467–473. https://doi.org/10.1007/s11018-018-1453-y
18. Goncharov D. S., Evtikhiev N. N., Krasnov V. V. et al., Comput. Opt., 2019, vol. 43, pp. 200–208. https://doi.org/10.18287/2412-6179-2019-43-2-200-208
19. Cheremkhin P. A., Evtikhiev N. N., Krasnov V. V. et al., Proc. SPIE, 2016, vol. 9889, pp. 98891M. https://doi.org/10.1117/12.2227767
Review
For citations:
Evtikhiev N.N., Krasnov V.V., Ryabcev I.P., Rodin V.G., Starikov R.S., Cheremkhin P.A. Measurement of phase modulation of LCOS SLM Santec SLM-200 and analysis of its applicability for optical reconstruction of images from diffractive elements. Izmeritel`naya Tekhnika. 2021;(5):4-8. (In Russ.) https://doi.org/10.32446/0368-1025it.2021-5-4-8