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Influence of surface curvature of silicon reference materials on its structural characteristics
https://doi.org/10.32446/0368-1025it.2022-5-35-41
Abstract
The features of four-circle diffractometers, which are used to identify the composition of substances and materials, as well as to determine many mechanical, physico-chemical and biologically functionally significant characteristics of substances at the arbitration level, are considered. When monitoring the operation and certification of these measuring systems, a system of certified reference materials (СSRM) of diff action properties, including, including the CSRM of the crystal lattice parameter, is used. The characteristics of this and other CSRMs are specified in this work in connection with the need to use the results of measurements on diff ractometers, taking into account the new quantum reality of modern technologies. According to the results of precision measurements of the unit cell size of standard samples of the diffraction properties of silicon CSRM, a change in the structural characteristics with a change in the diameter of the spheres of the samples was found. This size effect, found for the fi rst time in the millimeter range, is similar to the effect observed when changing the size of silicon nanoparticles and other substances with different types of chemical bonding of atoms. It is shown that the size effect must be taken into account when certifying standard samples used in testing four-circle diffractometers. The results are also important for understanding the nanostate of the analyte surface and will be useful in various industries.
Keywords
diffractometers for characterizing single crystals,
high-precision measurements,
curvature of spheres,
surface infl uence,
nanostate of substance,
Silicon size eff ect
Supporting agencies: the author is grateful to I. L. Kommel for his help in preparing the samples, prof. F. A. Sidorenko and P. B. Kodess for a detailed discussion of the results.
About the Author
B. N. Kodess
Russian Research Institute for Metrological Service
Russian Federation
Russian Federation
Boris N. Kodess
Moscow
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For citations:
Kodess B.N. Influence of surface curvature of silicon reference materials on its structural characteristics. Izmeritel`naya Tekhnika. 2022;(5):35-41. (In Russ.) https://doi.org/10.32446/0368-1025it.2022-5-35-41
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