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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">izmertech</journal-id><journal-title-group><journal-title xml:lang="ru">Измерительная техника</journal-title><trans-title-group xml:lang="en"><trans-title>Izmeritel`naya Tekhnika</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0368-1025</issn><issn pub-type="epub">2949-5237</issn><publisher><publisher-name>ФГУП "ВНИИФТРИ"</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.32446/0368-1025it-2018-8-43-46</article-id><article-id custom-type="elpub" pub-id-type="custom">izmertech-785</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>МЕХАНИЧЕСКИЕ ИЗМЕРЕНИЯ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>MECHANICAL MEASUREMENTS</subject></subj-group></article-categories><title-group><article-title>Устройство для механических испытаний элементов микро- и наносистем</article-title><trans-title-group xml:lang="en"><trans-title></trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Постников</surname><given-names>А. В.</given-names></name></name-alternatives><email xlink:type="simple">mems@yf-ftian.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff xml:lang="ru" id="aff-1"><institution>Ярославский филиал физико-технологического института РАН</institution><country>Russian Federation</country></aff><pub-date pub-type="collection"><year>2018</year></pub-date><pub-date pub-type="epub"><day>07</day><month>02</month><year>2023</year></pub-date><volume>0</volume><issue>8</issue><fpage>43</fpage><lpage>46</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; ФГУП "ВНИИФТРИ", 2023</copyright-statement><copyright-year>2023</copyright-year><copyright-holder xml:lang="ru">ФГУП "ВНИИФТРИ"</copyright-holder><copyright-holder xml:lang="en">ФГУП "ВНИИФТРИ"</copyright-holder><license xlink:href="https://www.izmt.ru/jour/about/submissions#copyrightNotice" xlink:type="simple"><license-p>https://www.izmt.ru/jour/about/submissions#copyrightNotice</license-p></license></permissions><self-uri xlink:href="https://www.izmt.ru/jour/article/view/785">https://www.izmt.ru/jour/article/view/785</self-uri><abstract><p>Представлено устройство для механических испытаний элементов микро- и наносистем на основе электродинамического актюатора, контролируемым образом развивающего усилия от 10-3 до 1 Н. Минимально регистрируемое изменение геометрии образца под нагрузкой составляет 0,3 мкм. Актюатор можно применять для растяжения, изгиба, сжатия образцов и их испытаний на усталость. С помощью актюатора можно определять механические характеристики тонких плёнок, проволок и микробалок длиной от единиц микрометров до нескольких миллиметров. Доступность актюатора и его нулевая жёсткость упрощают процедуру измерений.</p></abstract><trans-abstract xml:lang="en"><p>The paper presents testing system based on usage of electro dynamic actuator (Lorentz). The actuator capable of controllable load over a range 10-3 - 1 N. Specimen geometry change with an accuracy of 0,3 micrometers is achieved. The actuator is able to apply tension, bending, squeezing loads and periodic load for fatigue tests. The method could be applied for material characterization applications, such as microtensile testing of micrometer dimensioned films, wires, bending of millimeter-sized beams. The novel feature of our machine is that actuator is easily available and has zero stiffness</p></trans-abstract><kwd-group xml:lang="ru"><kwd>микро- и наносистемы</kwd><kwd>микрорастяжение</kwd><kwd>тонкие плёнки</kwd><kwd>микробалки</kwd><kwd>механические свойства</kwd><kwd>актюатор</kwd><kwd>micro mechanical systems</kwd><kwd>microtensile</kwd><kwd>thin films</kwd><kwd>micro beams</kwd><kwd>mechanical properties</kwd><kwd>actuator</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Tsuchiya T. Reliability of MEMS: Testing of Materials and Devices V6. N. Y.: Wiley, 2008.</mixed-citation><mixed-citation xml:lang="en">Tsuchiya T. Reliability of MEMS: Testing of Materials and Devices V6. N. Y.: Wiley, 2008.</mixed-citation></citation-alternatives></ref><ref id="cit2"><label>2</label><citation-alternatives><mixed-citation xml:lang="ru">Rigo S., Desmarres J. 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С. 38-40.</mixed-citation></citation-alternatives></ref></ref-list><fn-group><fn fn-type="conflict"><p>The authors declare that there are no conflicts of interest present.</p></fn></fn-group></back></article>
