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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">izmertech</journal-id><journal-title-group><journal-title xml:lang="ru">Измерительная техника</journal-title><trans-title-group xml:lang="en"><trans-title>Izmeritel`naya Tekhnika</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0368-1025</issn><issn pub-type="epub">2949-5237</issn><publisher><publisher-name>ФГУП "ВНИИФТРИ"</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.32446/0368-1025it-2018-8-7-9</article-id><article-id custom-type="elpub" pub-id-type="custom">izmertech-776</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ГОСУДАРСТВЕННЫЕ ЭТАЛОНЫ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>STATE STANDARDS</subject></subj-group></article-categories><title-group><article-title>Государственный первичный эталон единиц спектральных коэффициентов направленного пропускания, диффузного и зеркального отражений в диапазоне длин волн от 0,2 до 20,0 мкм ГЭТ 156-2015</article-title><trans-title-group xml:lang="en"><trans-title></trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Дунаев</surname><given-names>А. Ю.</given-names></name></name-alternatives><email xlink:type="simple">dunaev@vniiofi.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Золотаревский</surname><given-names>Ю. М.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Морозова</surname><given-names>С. П.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Саприцкий</surname><given-names>В. И.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Фиданян</surname><given-names>Г. С.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ерикова</surname><given-names>А. А.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff xml:lang="ru" id="aff-1"><institution>Всероссийский научно-исследовательский институт оптико-физических измерений</institution><country>Russian Federation</country></aff><pub-date pub-type="collection"><year>2018</year></pub-date><pub-date pub-type="epub"><day>07</day><month>02</month><year>2023</year></pub-date><volume>0</volume><issue>8</issue><fpage>7</fpage><lpage>9</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; ФГУП "ВНИИФТРИ", 2023</copyright-statement><copyright-year>2023</copyright-year><copyright-holder xml:lang="ru">ФГУП "ВНИИФТРИ"</copyright-holder><copyright-holder xml:lang="en">ФГУП "ВНИИФТРИ"</copyright-holder><license xlink:href="https://www.izmt.ru/jour/about/submissions#copyrightNotice" xlink:type="simple"><license-p>https://www.izmt.ru/jour/about/submissions#copyrightNotice</license-p></license></permissions><self-uri xlink:href="https://www.izmt.ru/jour/article/view/776">https://www.izmt.ru/jour/article/view/776</self-uri><abstract><p>Представлен состав Государственного первичного эталона единиц спектральных коэффициентов направленного пропускания, диффузного и зеркального отражений в диапазоне длин волн от 0,2 до 20,0 мкм ГЭТ 156-2015. Приведены метрологические характеристики эталона.</p></abstract><trans-abstract xml:lang="en"><p>Structure of the State Primary Standard GET 156-2015, intended for measurements of spectral regular transmittance, spectral diffuse and spectral regular reflectance in the wavelength range from 0,2 to 20,0 μm is presented. The metrological characteristics of the Standard are given</p></trans-abstract><kwd-group xml:lang="ru"><kwd>спектрофотометрия</kwd><kwd>направленное пропускание</kwd><kwd>диффузное отражение</kwd><kwd>зеркальное отражение</kwd><kwd>оптические свойства материалов</kwd><kwd>ключевые сличения</kwd><kwd>spectrophotometry</kwd><kwd>spectral regular transmittance</kwd><kwd>spectral diffuse reflectance</kwd><kwd>spectral regular reflectance</kwd><kwd>optical properties of materials</kwd><kwd>uncertainties</kwd><kwd>key comparison</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Erb W. Diffuse-directional radiance factor of reflection standards // Metrologia. 1997. No. 34. P. 431-432.</mixed-citation><mixed-citation xml:lang="en">Erb W. Diffuse-directional radiance factor of reflection standards // Metrologia. 1997. No. 34. P. 431-432.</mixed-citation></citation-alternatives></ref><ref id="cit2"><label>2</label><citation-alternatives><mixed-citation xml:lang="ru">Leonard M. Hanssen, Keith A. Snail. Integrating Spheres for Mid- and Near-infrared Reflection Spectroscopy. Chichester: John Wiley &amp; Sons Ltd, 2002.</mixed-citation><mixed-citation xml:lang="en">Leonard M. Hanssen, Keith A. Snail. Integrating Spheres for Mid- and Near-infrared Reflection Spectroscopy. Chichester: John Wiley &amp; Sons Ltd, 2002.</mixed-citation></citation-alternatives></ref><ref id="cit3"><label>3</label><citation-alternatives><mixed-citation xml:lang="ru">ГОСТ 8.557-2007. ГСИ. Государственная поверочная схема для средств измерений спектральных, интегральных и редуцированных коэффициентов направленного пропускания и оптической плотности в диапазоне длин волн от 0,2 до 50,0 мкм, диффузного и зеркального отражений в диапазоне длин волн от 0,2 до 20,0 мкм.</mixed-citation><mixed-citation xml:lang="en">ГОСТ 8.557-2007. ГСИ. Государственная поверочная схема для средств измерений спектральных, интегральных и редуцированных коэффициентов направленного пропускания и оптической плотности в диапазоне длин волн от 0,2 до 50,0 мкм, диффузного и зеркального отражений в диапазоне длин волн от 0,2 до 20,0 мкм.</mixed-citation></citation-alternatives></ref><ref id="cit4"><label>4</label><citation-alternatives><mixed-citation xml:lang="ru">Koo A. Report on the consultative committee for photometry and radiometry key comparison of regular spectral transmittance 2010 (CCPR-K6.2010) // Metrologia. Tech. Suppl. 2017. V. 54. 02001. https://doi.org/10.1088/0026-1394/54/1A/02001.</mixed-citation><mixed-citation xml:lang="en">Koo A. Report on the consultative committee for photometry and radiometry key comparison of regular spectral transmittance 2010 (CCPR-K6.2010) // Metrologia. Tech. Suppl. 2017. V. 54. 02001. https://doi.org/10.1088/0026-1394/54/1A/02001.</mixed-citation></citation-alternatives></ref></ref-list><fn-group><fn fn-type="conflict"><p>The authors declare that there are no conflicts of interest present.</p></fn></fn-group></back></article>
