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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">izmertech</journal-id><journal-title-group><journal-title xml:lang="ru">Измерительная техника</journal-title><trans-title-group xml:lang="en"><trans-title>Izmeritel`naya Tekhnika</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0368-1025</issn><issn pub-type="epub">2949-5237</issn><publisher><publisher-name>ФГУП "ВНИИФТРИ"</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">izmertech-543</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>МЕХАНИЧЕСКИЕ ИЗМЕРЕНИЯ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>MECHANICAL MEASUREMENTS</subject></subj-group></article-categories><title-group><article-title>Моделирование и оценка параметровморфологии поверхностей тонких пленок нанои микроэлектромеханических систем</article-title><trans-title-group xml:lang="en"><trans-title></trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Васильев</surname><given-names>В. А.</given-names></name></name-alternatives><email xlink:type="simple">opto@bk.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Чернов</surname><given-names>П. С.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff xml:lang="ru" id="aff-1"><institution>Пензенский государственный университет, Пенза</institution><country>Russian Federation</country></aff><pub-date pub-type="collection"><year>2012</year></pub-date><pub-date pub-type="epub"><day>07</day><month>02</month><year>2023</year></pub-date><volume>0</volume><issue>12</issue><fpage>13</fpage><lpage>16</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; ФГУП "ВНИИФТРИ", 2023</copyright-statement><copyright-year>2023</copyright-year><copyright-holder xml:lang="ru">ФГУП "ВНИИФТРИ"</copyright-holder><copyright-holder xml:lang="en">ФГУП "ВНИИФТРИ"</copyright-holder><license xlink:href="https://www.izmt.ru/jour/about/submissions#copyrightNotice" xlink:type="simple"><license-p>https://www.izmt.ru/jour/about/submissions#copyrightNotice</license-p></license></permissions><self-uri xlink:href="https://www.izmt.ru/jour/article/view/543">https://www.izmt.ru/jour/article/view/543</self-uri><abstract><p>Рассмотрены тонкопленочные нано- и микроэлектромеханические системы датчиков давления, экспериментальные и теоретические методы изучения и результаты оценки параметров морфологии поверхностей пленок. Разработаны модель и алгоритм роста тонких пленок, учитывающие диффузию частиц.</p></abstract><trans-abstract xml:lang="en"><p>The thin film nano-and microelectromechanical systems of pressure sensors, experimental and theoretical methods of study and estimation results of films surfaces morphology are considered. The model and algorithm of thin filmsgrowth with taking into account the particlesdiffusion is developed.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>нано- и микроэлектромеханические системы</kwd><kwd>датчики</kwd><kwd>тонкие пленки</kwd><kwd>морфология поверхности</kwd><kwd>nano-and microelectromechanical systems</kwd><kwd>sensors</kwd><kwd>thin films</kwd><kwd>surface morphology</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Белозубов Е.М., Васильев В.А., Громков Н.В.Тонкопленочные нано- и микроэлектромеханические системы – основа современных и перспективных датчиков давления для ракетной и авиационной техники // Измерительная техника. 2009.№ 7. 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