<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.3 20210610//EN" "JATS-journalpublishing1-3.dtd">
<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">izmertech</journal-id><journal-title-group><journal-title xml:lang="ru">Измерительная техника</journal-title><trans-title-group xml:lang="en"><trans-title>Izmeritel`naya Tekhnika</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0368-1025</issn><issn pub-type="epub">2949-5237</issn><publisher><publisher-name>ФГУП "ВНИИФТРИ"</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.32446/0368-1025it.2024-6-26-31</article-id><article-id custom-type="elpub" pub-id-type="custom">izmertech-2210</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ОПТИКО-ФИЗИЧЕСКИЕ ИЗМЕРЕНИЯ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>OPTICOPHYSICAL MEASUREMENTS</subject></subj-group></article-categories><title-group><article-title>Измерение оптической плотности в узкой полосе длин волн: метод коррекции результатов непрямых измерений</article-title><trans-title-group xml:lang="en"><trans-title>Measurement of optical density in a narrow wavelength band: a method for correcting the results of indirect measurements</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Иванов</surname><given-names>А. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Ivanov</surname><given-names>A. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Александр Вячеславович Иванов</p><p>Москва</p></bio><bio xml:lang="en"><p>Alexander V. Ivanov</p><p>Moscow</p></bio><email xlink:type="simple">ivanov@vniiofi.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-2331-3267</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Марченко</surname><given-names>С. Н.</given-names></name><name name-style="western" xml:lang="en"><surname>Marchenko</surname><given-names>S. N.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Сергей Николаевич Марченко</p><p>Москва</p></bio><bio xml:lang="en"><p>Sergey N. Marchenko</p><p>Moscow</p></bio><email xlink:type="simple">marchenko@vniiofi.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-4296-3468</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Колдашов</surname><given-names>А. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Koldashov</surname><given-names>A. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Артем Владимирович Колдашов</p><p>Москва</p></bio><bio xml:lang="en"><p>Artem V. Koldashov</p><p>Moscow</p></bio><email xlink:type="simple">koldashov@vniiofi.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0003-4305-9654</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Зябликов</surname><given-names>Д. Н.</given-names></name><name name-style="western" xml:lang="en"><surname>Zyablikov</surname><given-names>D. N.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Дмитрий Николаевич Зябликов</p><p>Москва</p></bio><bio xml:lang="en"><p>Dmitry N. Zyablikov</p><p>Moscow</p></bio><email xlink:type="simple">zyablikov@vniiofi.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Всероссийский научно-исследовательский институт оптико-физических измерений</institution><country>Россия</country></aff><aff xml:lang="en"><institution>All-Russian Research Institute for Optical and Physical Measurements</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2024</year></pub-date><pub-date pub-type="epub"><day>16</day><month>08</month><year>2024</year></pub-date><volume>73</volume><issue>6</issue><fpage>28</fpage><lpage>33</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; ФГУП "ВНИИФТРИ", 2024</copyright-statement><copyright-year>2024</copyright-year><copyright-holder xml:lang="ru">ФГУП "ВНИИФТРИ"</copyright-holder><copyright-holder xml:lang="en">ФГУП "ВНИИФТРИ"</copyright-holder><license xlink:href="https://www.izmt.ru/jour/about/submissions#copyrightNotice" xlink:type="simple"><license-p>https://www.izmt.ru/jour/about/submissions#copyrightNotice</license-p></license></permissions><self-uri xlink:href="https://www.izmt.ru/jour/article/view/2210">https://www.izmt.ru/jour/article/view/2210</self-uri><abstract><p>Рассмотрены вопросы соответствия результатов прямых и непрямых измерений оптической плотности в узкой полосе длин волн. Оптическую плотность в узкой полосе длин волн измеряли методом фильтрации светового потока согласно международному стандарту ISO 5-3:2009 “Photography and graphic technology – Density measurements. Part 3: Spectral conditions” (прямое измерение) и спектральным методом (непрямое измерение). С целью обеспечения единства измерений оптической плотности в узкой полосе длин волн и установления прослеживаемости результатов измерений к Государственному первичному эталону единицы оптической плотности ГЭТ 206-2016 исследована степень соответствия результатов, полученных двумя методами. Описаны методики измерений оптической плотности в узкой полосе длин волн для каждого метода. Метод фильтрации светового потока реализован с помощью ГЭТ 206-2016, а именно с использованием комплекса по измерению диффузной оптической плотности в проходящем свете. Для реализации спектральногометода применён спектрофотометр Cary 7000 (Agilent, США). Приведены данные по измерению оптической плотности стеклянных светофильтров двумяметодами. Разработанметод коррекции результатов спектральных измерений и определена поправка к результатам спектральных измерений. Разработанный метод и поправка позволяют установить соответствие результатов спектральных измерений и измерений методом фильтрации светового потока. Также описанный метод коррекции результатов спектральных измерений позволяет устанавливать прослеживаемость результатов измерений оптической плотности спектральнымметодомк результатамизмерений с помощью ГЭТ 206-2016.</p></abstract><trans-abstract xml:lang="en"><p>The issues of correspondence of the results of direct and indirect measurements of optical density in a narrow wavelength band are considered. The optical density in a narrow wavelength band was measured by filtering the luminous flux according to the international standard ISO 5-3:2009 “Photography and graphic technology – Density measurements. Part 3: Spectral conditions” (direct measurement) and spectral method (indirect measurement). In order to ensure the uniformity of optical density measurements in a narrow wavelength band and establish the traceability of measurement results to the State Primary Standard of optical density units GET 206-2016, the degree of conformity of the results obtained by two methods was investigated. The techniques of measuring optical density in a narrow wavelength band for each method are described. The method of fi ltering the luminous flux was implemented using GET 206-2016, namely using a complex for measuring diffuse optical transmittance density. The Cary 7000 spectrophotometer (Agilent, USA) was used to implement the spectral method. Data on measuring the optical density of glass light fi lters by two methods are presented. A method for correcting the results of spectral measurements has been developed and a correction to the results of spectral measurements has been determined. The developed method and the correction make it possible to establish the correspondence of the results of spectral measurements to the results of measurements by fi ltering the luminous fl ux. Also, the described method for correcting the results of spectral measurements makes it possible to establish the traceability of the results of optical density measurements by the spectral method to the measurement results using GET 206-2016.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>оптическая плотность</kwd><kwd>денситометр</kwd><kwd>государственный первичный эталон</kwd><kwd>спектрофотометр</kwd></kwd-group><kwd-group xml:lang="en"><kwd>optical density</kwd><kwd>densitometer</kwd><kwd>state primary standard</kwd><kwd>spectrophotometer</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Долгов В. В., Ованесов Е. И., Щетникович К. А. Фотометрия в лабораторной практике. Российская медицинская академия последипломного образования, Москва, 2004.</mixed-citation><mixed-citation xml:lang="en">Dolgov V. V., Ovanesov E. I., Shetnikovich K. A. Photometry in laboratory practice. The Russian Medical Academy of Postgraduate Education, Moscow, 2004. (In Russ.)</mixed-citation></citation-alternatives></ref><ref id="cit2"><label>2</label><citation-alternatives><mixed-citation xml:lang="ru">Неразрушающий контроль. Справочник. Под общ. ред. В. В. Клюева. Т. 6, кн. 2. В. Н. Филинов, А. А. Кеткович, М. В. Филинов. Оптический контроль. Машиностроение, Москва (2006).</mixed-citation><mixed-citation xml:lang="en">Non-destructive testing. Reference book. Ed. V. V. Klyuev, vol. 6, book 2, V. N. Filinov, A. A. Ketkovich, M. V. Filinov. Optical control, Moscow, Mashinostroenie Publ., 2006.</mixed-citation></citation-alternatives></ref><ref id="cit3"><label>3</label><citation-alternatives><mixed-citation xml:lang="ru">Андреев В. И., Лясковский В. Л., Втулкин П. П., Марченко С. Н., Шатов А. В. Разработка Государственного первичного эталона единицы оптической плотности ГЭТ 206-2013. Законодательная и прикладная метрология, (6(133)), 38–43 (2014). https://www.elibrary.ru/szfrbn</mixed-citation><mixed-citation xml:lang="en">Andreev V. I., Lyaskovskii V. L., Vtulkin P. P., Marchenko S. N., Shatov A. V. Development of the state primary standard for the unit of optical density get 206-2013. Legal and Applied Metrology, (6(133)), 38–43 (2014). (In Russ.) https://www.elibrary.ru/szfrbn</mixed-citation></citation-alternatives></ref><ref id="cit4"><label>4</label><citation-alternatives><mixed-citation xml:lang="ru">Зябликов Д. Н., Иванов А. В., Колдашов А. В., Марченко С. Н. Государственный первичный эталон единицы оптической плотности ГЭТ 206-2016. Измерительная техника, (8), 3–7 (2021). https://doi.org/10.32446/0368-1025it.2021-8-3-7</mixed-citation><mixed-citation xml:lang="en">Zyablikov D. N., Ivanov A.V., Koldashov A. V., Marchenko S. N. State primary standard of optical density unit GET 206-2016. Measurement Techniques, 64(8), 607–612 (2021). https://doi.org/10.1007/s11018-021-01979-1</mixed-citation></citation-alternatives></ref><ref id="cit5"><label>5</label><citation-alternatives><mixed-citation xml:lang="ru">Тишакова К.Д., Мороз К.А. Выявление зависимости между спектральным коэффициентом направленного пропускания и оптической плотностью светофильтров спектрофотометра. Фундаментальные исследования, методы и алгоритмы прикладной математики в технике, медицине и экономике. Материалы 16-й Международной молодежной научно-практической конференции, Новочеркасск, 26–27 октября 2017, с. 177–181. ООО «Лик», Новочеркасск (2017). https://www.elibrary.ru/zwiwhz</mixed-citation><mixed-citation xml:lang="en">Tishakova K. D., Moroz K. A. Identifi cation оf the dependence between spectral transmittance and optical density of light fi lters of the spectrophotometer. Fundamental research, methods and algorithms of applied mathematics in engineering, medicine and economics. Materials of the 16th International Youth Scientifi c and Practical Conference, Novocherkassk, October 26–27, 2017, pp. 177–181. LLC “Lik”, Novocherkassk (2017). (In Russ.) https://www.elibrary.ru/zwiwhz</mixed-citation></citation-alternatives></ref><ref id="cit6"><label>6</label><citation-alternatives><mixed-citation xml:lang="ru">Lequime M., Zerrad M., Amra C. Breakthrough spectrophotometric instrument for the ultra-fi ne characterization of the spectral transmittance of thin-fi lm optical fi lters. Optics Express, 26(26), 34236–34249 (2018). https://doi.org/10.1364/OE.26.034236</mixed-citation><mixed-citation xml:lang="en">Lequime M., Zerrad M., Amra C. Breakthrough spectrophotometric instrument for the ultra-fi ne characterization of the spectral transmittance of thin-fi lm optical fi lters. Optics Express, 26(26), 34236–34249 (2018). https://doi.org/10.1364/OE.26.034236</mixed-citation></citation-alternatives></ref><ref id="cit7"><label>7</label><citation-alternatives><mixed-citation xml:lang="ru">Spitschan M., Lazar R., Cajochen C. Visual and non-visual properties of fi lters manipulating short-wavelength light. Ophthalmic and Physiological Optics, 39(6), 459–468 (2019). https://doi.org/10.1111/opo.12648</mixed-citation><mixed-citation xml:lang="en">Spitschan M., Lazar R., Cajochen C. Visual and non-visual properties of fi lters manipulating short-wavelength light. Ophthalmic and Physiological Optics, 39(6), 459–468 (2019). https://doi.org/10.1111/opo.12648</mixed-citation></citation-alternatives></ref><ref id="cit8"><label>8</label><citation-alternatives><mixed-citation xml:lang="ru">Lü Sh., Wang R., Ma J., Jiang C., Mu J., Zhao S., Yin X. Design and manufacture of super-multilayer optical fi lters based on PARMS technology. Advanced Optical Technologies, 7(1-2), 49–55 (2018). https://doi.org/10.1515/aot-2017-0075</mixed-citation><mixed-citation xml:lang="en">Lü Sh., Wang R., Ma J., Jiang C., Mu J., Zhao S., Yin X. Design and manufacture of super-multilayer optical fi lters based on PARMS technology. Advanced Optical Technologies, 7(1-2), 49–55 (2018). https://doi.org/10.1515/aot-2017-0075</mixed-citation></citation-alternatives></ref><ref id="cit9"><label>9</label><citation-alternatives><mixed-citation xml:lang="ru">Yadav M., Yadav S., Shankar A., Bala R., Rani M. Thickness-related variation in the structure, morphology and optical characteristics of nickel thin fi lms for neutral density fi ltering. Physica Scripta, 99(4), 045949 (2024). https://doi.org/10.1088/1402-4896/ad30e5</mixed-citation><mixed-citation xml:lang="en">Yadav M., Yadav S., Shankar A., Bala R., Rani M. Thickness-related variation in the structure, morphology and optical characteristics of nickel thin fi lms for neutral density fi ltering. Physica Scripta, 99(4), 045949 (2024). https://doi.org/10.1088/1402-4896/ad30e5</mixed-citation></citation-alternatives></ref></ref-list><fn-group><fn fn-type="conflict"><p>The authors declare that there are no conflicts of interest present.</p></fn></fn-group></back></article>
