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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">izmertech</journal-id><journal-title-group><journal-title xml:lang="ru">Измерительная техника</journal-title><trans-title-group xml:lang="en"><trans-title>Izmeritel`naya Tekhnika</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0368-1025</issn><issn pub-type="epub">2949-5237</issn><publisher><publisher-name>ФГУП "ВНИИФТРИ"</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.32446/0368-1025it.2024-6-46-54</article-id><article-id custom-type="elpub" pub-id-type="custom">izmertech-2147</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>РАДИОТЕХНИЧЕСКИЕ ИЗМЕРЕНИЯ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>RADIO MEASUREMENTS</subject></subj-group></article-categories><title-group><article-title>Повышение точности измерений бистатических характеристик рассеяния материалов образцов различных конфигураций</article-title><trans-title-group xml:lang="en"><trans-title>Improving the accuracy of measurement of bistatic scattering characteristics of material samples in various conf gurations</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0009-0006-7466-619X</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Гильмутдинов</surname><given-names>Р. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Gilmutdinov</surname><given-names>R. G.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Руслан Валерьевич Гильмутдинов</p><p>г. Долгопрудный, Московская обл.</p></bio><bio xml:lang="en"><p>Ruslan V. Gilmutdinov</p><p>Dolgoprudny, Moscow Region</p></bio><email xlink:type="simple">psevduch777@gmail.com</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Меньших</surname><given-names>Н. Л.</given-names></name><name name-style="western" xml:lang="en"><surname>Menshikh</surname><given-names>N. L.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Николай Леонидович Меньших</p><p>г. Долгопрудный, Московская обл.</p></bio><bio xml:lang="en"><p>Nikolay L. Menshikh</p><p>Moscow</p></bio><email xlink:type="simple">n.menshikh@gmail.com</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Фёдоров</surname><given-names>С. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Fedorov</surname><given-names>S. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Сергей Александрович Федоров</p><p>Москва</p></bio><bio xml:lang="en"><p>Sergey A. Fedorov</p><p>Moscow</p></bio><email xlink:type="simple">fys99@mail.ru</email><xref ref-type="aff" rid="aff-2"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Московский физико-технический институт (национальный исследовательский университет); Институт теоретической и прикладной электродинамики Российской Академии наук</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Moscow Institute of Physics and Technology; Institute for Theoretical and Applied Electrodynamics Russian Academy of Sciences</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>Институт теоретической и прикладной электродинамики Российской Академии наук</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Institute for Theoretical and Applied Electrodynamics Russian Academy of Sciences</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2024</year></pub-date><pub-date pub-type="epub"><day>25</day><month>07</month><year>2024</year></pub-date><volume>73</volume><issue>6</issue><fpage>48</fpage><lpage>56</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; ФГУП "ВНИИФТРИ", 2024</copyright-statement><copyright-year>2024</copyright-year><copyright-holder xml:lang="ru">ФГУП "ВНИИФТРИ"</copyright-holder><copyright-holder xml:lang="en">ФГУП "ВНИИФТРИ"</copyright-holder><license xlink:href="https://www.izmt.ru/jour/about/submissions#copyrightNotice" xlink:type="simple"><license-p>https://www.izmt.ru/jour/about/submissions#copyrightNotice</license-p></license></permissions><self-uri xlink:href="https://www.izmt.ru/jour/article/view/2147">https://www.izmt.ru/jour/article/view/2147</self-uri><abstract><p>Исследованы бистатические свойства рассеяния образцов композитных радиопоглощающих материалов. Рассмотрено влияние дифракционных эффектов на краях плоских образцов малых (2–4 длины волны падающего излучения) размеров на результаты измерений коэффициента отражения материала образца – бистатической характеристики, зависящей от частоты излучения в широком (10–85°) диапазоне углов падения. Для уменьшения влияния дифракционных эффектов разработаны образцы различных конфигураций, изготовленные из магнитодиэлектрика с частотной дисперсией диэлектрической и магнитной проницаемостей. Образцы представляют собой металлическую подложку, на одну сторону которой нанесён исследуемый материал, а остальные поверхности подложки покрыты радиопоглощающим материалом. Рассеивающие характеристики разработанных образцов численно рассчитаны и экспериментально измерены на стенде для бистатических измерений в безэховой камере. Экспериментальные результаты соответствуют расчётным данным. Показано заметное уменьшение влияния дифракционных эффектов на коэффициент отражения в широком угловом и частотном диапазонах. Численными методами в программном пакете FEKO исследовано влияние конфигурации образца на методическую погрешность измерений коэффициента отражения. Показано, что данную погрешность можно уменьшить при использовании подложки протяжённой формы в плоскости падения (образцы гибридных конфигураций). Полученные результаты можно использовать при измерении характеристик рассеяния материалов в свободном пространстве, например при уточнении материальных параметров.</p></abstract><trans-abstract xml:lang="en"><p>The infl uence of diffraction effects at the edges of fl at samples of small (2–4 wavelengths of incident wave) sizes on the results of measurements of the refl ection coeffi cient of the sample material, a bistatic characteristic that depends on the frequency of radiation in a wide (10–85°) range of incidence angles is considered. To reduce the infl uence of diffraction effects, samples of various confi gurations have been developed, made of magnetodielectric with frequency dispersion of dielectric and magnetic permeability. The samples are a metal plate, on one side of which the material under study is applied, and the other surfaces of the plate are covered with radiation-absorbent material. The scattering characteristics of samples of the developed confi gurations are numerically calculated and experimentally measured on a bistatic facility in an anechoic chamber. The experimental results correspond with the calculated data. A noticeable reduction in the infl uence of diffraction effects on the refl ectivity values in a wide angular and frequency range has been shown. Using numerical methods in the FEKO software package, the infl uence of the sample confi guration on the methodical error in refl ectance measurements was studied. It is shown that this error can be reduced by using a substrate of an extended shape in the plane of incidence (samples of a hybrid confi guration). The results obtained can be used to measure the scattering characteristics of materials in free space.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>конфигурация образцов</kwd><kwd>измерения бистатических характеристик рассеяния</kwd><kwd>дифракционные эффекты</kwd><kwd>безэховая камера</kwd><kwd>коэффициент отражения</kwd><kwd>методическая погрешность</kwd></kwd-group><kwd-group xml:lang="en"><kwd>samples in various confi gurations</kwd><kwd>measurement of bistatic scattering characteristics</kwd><kwd>difraction effects</kwd><kwd>anechoic electromagnetic chamber</kwd><kwd>refl ection coeffi cient</kwd><kwd>methodical error</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">SudhaRani K., Krishna Chaitanya T. 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