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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">izmertech</journal-id><journal-title-group><journal-title xml:lang="ru">Измерительная техника</journal-title><trans-title-group xml:lang="en"><trans-title>Izmeritel`naya Tekhnika</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0368-1025</issn><issn pub-type="epub">2949-5237</issn><publisher><publisher-name>ФГУП "ВНИИФТРИ"</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">izmertech-213</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>НАНОМЕТРОЛОГИЯ</subject></subj-group></article-categories><title-group><article-title>Измерение локальной термоЭДС металлов методом сканирующей туннельной спектроскопии</article-title><trans-title-group xml:lang="en"><trans-title></trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Троян</surname><given-names>В. И.</given-names></name></name-alternatives><email xlink:type="simple">troyan@mephi.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Борисюк</surname><given-names>П. В.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Васильев</surname><given-names>О. С.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Красавин</surname><given-names>А. В.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Флоренцев</surname><given-names>В. В.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff xml:lang="ru" id="aff-1"><institution>Национальный исследовательский ядерный университет «МИФИ»</institution><country>Russian Federation</country></aff><pub-date pub-type="collection"><year>2014</year></pub-date><pub-date pub-type="epub"><day>07</day><month>02</month><year>2023</year></pub-date><volume>0</volume><issue>8</issue><fpage>9</fpage><lpage>12</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; ФГУП "ВНИИФТРИ", 2023</copyright-statement><copyright-year>2023</copyright-year><copyright-holder xml:lang="ru">ФГУП "ВНИИФТРИ"</copyright-holder><copyright-holder xml:lang="en">ФГУП "ВНИИФТРИ"</copyright-holder><license xlink:href="https://www.izmt.ru/jour/about/submissions#copyrightNotice" xlink:type="simple"><license-p>https://www.izmt.ru/jour/about/submissions#copyrightNotice</license-p></license></permissions><self-uri xlink:href="https://www.izmt.ru/jour/article/view/213">https://www.izmt.ru/jour/article/view/213</self-uri><abstract><p>Представлены результаты исследований туннельных вольт-амперных характеристик металлических образцов Au, Pt и Pd при комнатной температуре. Обнаружено, что в области малых напряжений ( В) зависимость туннельного тока от прикладываемой разности потенциалов между зондом и образцом линейна, и ее наклон различен для разных образцов. Предложена оригинальная методика локального измерения термоЭДС металлических образцов и нанокластеров металлов на поверхности подложки бесконтактным методом.</p></abstract><trans-abstract xml:lang="en"><p>The results of study of tunneling current voltage characteristic for metal samples of Au, Pt and Pd at room temperature are presented. It was found that at low voltages ( V) the dependence of the tunneling current from the applied potential difference between the probe and the sample is linear and its slope is different for different samples. The observed features of the tunneling current voltage characteristic allow to offer an original procedure of non-invasive probing of the thermo-voltage of metallic samples and nanoclusters on the substrate surface.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>нанокластеры</kwd><kwd>термоЭДС</kwd><kwd>сканирующая туннельная микроскопия</kwd><kwd>эффект Зеебека</kwd><kwd>nanoclusters</kwd><kwd>thermo-voltage</kwd><kwd>scanning tunneling microscopy</kwd><kwd>Zeebeck effect</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Scheibner R., Novik E. G., Borzenko T. e. a. Sequential and cotunneling behavior in the temperature-dependent thermopower of few-electron quantum dots // Phys. Rev. B. 2007. V. 75. N. 4. P. 041301-1-041301-4.</mixed-citation><mixed-citation xml:lang="en">Scheibner R., Novik E. G., Borzenko T. e. a. 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