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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">izmertech</journal-id><journal-title-group><journal-title xml:lang="ru">Измерительная техника</journal-title><trans-title-group xml:lang="en"><trans-title>Izmeritel`naya Tekhnika</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0368-1025</issn><issn pub-type="epub">2949-5237</issn><publisher><publisher-name>ФГУП "ВНИИФТРИ"</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.32446/0368-1025it.2020-12-51-57</article-id><article-id custom-type="elpub" pub-id-type="custom">izmertech-1987</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>МЕЖДУНАРОДНОЕ СОТРУДНИЧЕСТВО</subject></subj-group></article-categories><title-group><article-title>Оценка эквивалентности шкал спектральной плотности энергетической яркости по результатам международных сличений между национальными метрологическими институтами Кореи, Китая и России</article-title><trans-title-group xml:lang="en"><trans-title>Assessment of Equivalence of the Spectral Radiance Scales following the results of the comparison between the National Metrology Institutes of Korea, China, and Russia</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Шин</surname><given-names>Д. Ж.</given-names></name><name name-style="western" xml:lang="en"><surname>Shin</surname><given-names>D.</given-names></name></name-alternatives><bio xml:lang="ru"><p>г. Тэджон</p></bio><bio xml:lang="en"><p>Dong-Joo Shin</p><p>Daejeon</p></bio><email xlink:type="simple">djshin@kriss.re.kr</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Хлевной</surname><given-names>Б. Б.</given-names></name><name name-style="western" xml:lang="en"><surname>Khlevnoy</surname><given-names>B. B.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Москва</p></bio><bio xml:lang="en"><p>Boris B. Khlevnoy</p><p>Moscow</p></bio><email xlink:type="simple">khlevnoy-m4@vniiofi.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Дай</surname><given-names>Ц.</given-names></name><name name-style="western" xml:lang="en"><surname>Da</surname><given-names>C.</given-names></name></name-alternatives><bio xml:lang="ru"><p>г. Пекин</p></bio><bio xml:lang="en"><p>Caihong Da</p><p>Beijing</p></bio><email xlink:type="simple">daicaihong@nim.ac.cn</email><xref ref-type="aff" rid="aff-3"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Пак</surname><given-names>С. Ч.</given-names></name><name name-style="western" xml:lang="en"><surname>Park</surname><given-names>S.</given-names></name></name-alternatives><bio xml:lang="ru"><p>г. Тэджон </p></bio><bio xml:lang="en"><p>Seongchong Park</p><p>Daejeon</p></bio><email xlink:type="simple">spark@kriss.re.kr</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ли</surname><given-names>Д. Х.</given-names></name><name name-style="western" xml:lang="en"><surname>Lee</surname><given-names>D.</given-names></name></name-alternatives><bio xml:lang="ru"><p>г. Тэджон </p></bio><bio xml:lang="en"><p>Dong-Hoon Lee</p><p>Daejeon</p><p> </p></bio><email xlink:type="simple">spark@kriss.re.kr</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Солодилов</surname><given-names>М. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Solodilov</surname><given-names>M. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Москва</p></bio><bio xml:lang="en"><p>Maxim V. Solodilov</p><p>Moscow</p></bio><email xlink:type="simple">solodilov@vniiofi.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Колесникова</surname><given-names>С. С.</given-names></name><name name-style="western" xml:lang="en"><surname>Kolesnikova</surname><given-names>S. S.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Москва</p></bio><bio xml:lang="en"><p>Svetlana S. Kolesnikova</p><p>Moscow</p></bio><email xlink:type="simple">kolesnikova-m4@vniiofi.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>У</surname><given-names>Ж.</given-names></name><name name-style="western" xml:lang="en"><surname>Wu</surname><given-names>Z.</given-names></name></name-alternatives><bio xml:lang="ru"><p> г. Пекин</p></bio><bio xml:lang="en"><p>Zhifeng Wu</p><p>Beijing</p></bio><email xlink:type="simple">daicaihong@nim.ac.cn</email><xref ref-type="aff" rid="aff-3"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ван</surname><given-names>Я.</given-names></name><name name-style="western" xml:lang="en"><surname>Wang</surname><given-names>Ya.</given-names></name></name-alternatives><bio xml:lang="ru"><p>г. Пекин</p></bio><bio xml:lang="en"><p>Yanfei Wang</p><p>Beijing</p><p> </p></bio><email xlink:type="simple">wangyf@nim.ac.cn</email><xref ref-type="aff" rid="aff-3"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Корейский научно-исследовательский институт стандартов и науки (KRISS)</institution><country>Южная Корея</country></aff><aff xml:lang="en"><institution>Korea Research Institute of Standards and Science (KRISS)</institution><country>Korea, Republic of</country></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>Всероссийский научно-исследовательский институт оптико-физических измерений</institution><country>Россия</country></aff><aff xml:lang="en"><institution>All-Russian Research Institute for Optical and Physical Measurements (VNIIOFI)</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-3"><aff xml:lang="ru"><institution>Национальный институт метрологии (NIM)</institution><country>Китай</country></aff><aff xml:lang="en"><institution>National Institute of Metrology (NIM)</institution><country>China</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2020</year></pub-date><pub-date pub-type="epub"><day>22</day><month>09</month><year>2023</year></pub-date><volume>0</volume><issue>12</issue><fpage>51</fpage><lpage>57</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; ФГУП "ВНИИФТРИ", 2023</copyright-statement><copyright-year>2023</copyright-year><copyright-holder xml:lang="ru">ФГУП "ВНИИФТРИ"</copyright-holder><copyright-holder xml:lang="en">ФГУП "ВНИИФТРИ"</copyright-holder><license xlink:href="https://www.izmt.ru/jour/about/submissions#copyrightNotice" xlink:type="simple"><license-p>https://www.izmt.ru/jour/about/submissions#copyrightNotice</license-p></license></permissions><self-uri xlink:href="https://www.izmt.ru/jour/article/view/1987">https://www.izmt.ru/jour/article/view/1987</self-uri><abstract><p>В рамках международных сличений оценена эквивалентность воспроизводимых в национальных метрологических институтах Кореи (KRISS), Китая (NIM) и России (ВНИИОФИ) шкал спектральной плотности энергетической яркости в диапазоне длин волн 250–2500 нм. В сличениях в качестве артефакта использован общий набор из трёх вольфрамовых ленточных ламп, значения спектральной плотности энергетической яркости которых измерены поочередно каждой из лабораторий. Измерения проводились вслепую. На основе этой серии измерений на каждой длине волны определено опорное значение сличений как средневзвешенное результатов измерений трёх лабораторий. Степень эквивалентности каждой лаборатории рассчитана как отклонение результата измерения этой лаборатории от опорного значения. Предложен метод обработки данных для расчёта степеней эквивалентности и их неопределённостей. Метод основан на анализе отношений, а не разностей спектральной плотности энергетической яркости, что позволяет исключить влияние результатов одной конкретной лаборатории на результаты других. Результаты сличений подтверждают эквивалентность шкал спектральной плотности энергетической яркости всех лабораторий-участниц в пределах их расширенных неопределённостей (при коэффициенте охвата ) за исключением отдельных длин волн.</p></abstract><trans-abstract xml:lang="en"><p>The paper presents the assessment of equivalence of the spectral radiance scales in the wavelength range from 250 nm to 2500 nm, reproduced at the national metrology institutes of Korea (KRISS), China (NIM) and Russia (VNIIOFI), carried out in the framework of international comparison. The common set of three tungsten strip lamps was used as an artefact. Based on a series of blind measurements of the lamps spectral radiance performed at each laboratory, the reference value of the comparison was determined at each wavelength as a weighted mean of the measured data of three laboratories. The degree of equivalence of each laboratory was then calculated as the deviation of the measurement data of that participant from the reference value. A data analysis method was proposed for calculating the degree of equivalences and their uncertainties. The method is based on processing spectral radiance ratios, rather than differences, which allows eliminating the influence of a result of one particular participant to results of other laboratories. The comparison results confirm the equivalence of spectral radiance scales of all the laboratories within their (k=2) expanded uncertainties except a few wavelength points.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>спектральная плотность энергетической яркости</kwd><kwd>вольфрамовая ленточная лампа</kwd><kwd>степень эквивалентности</kwd><kwd>высокотемпературное чёрное тело.</kwd></kwd-group><kwd-group xml:lang="en"><kwd>spectral radiance</kwd><kwd>tungsten strip lamp</kwd><kwd>degree of equivalence (DoE)</kwd><kwd>high-temperature blackbody</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Международная система единиц ( SI). 9-е издание.2019. 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