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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">izmertech</journal-id><journal-title-group><journal-title xml:lang="ru">Измерительная техника</journal-title><trans-title-group xml:lang="en"><trans-title>Izmeritel`naya Tekhnika</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0368-1025</issn><issn pub-type="epub">2949-5237</issn><publisher><publisher-name>ФГУП "ВНИИФТРИ"</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.32446/0368-1025it.2020-4-8-13</article-id><article-id custom-type="elpub" pub-id-type="custom">izmertech-1772</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ЛИНЕЙНЫЕ И УГЛОВЫЕ ИЗМЕРЕНИЯ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>LINEAR AND ANGULAR MEASUREMENTS</subject></subj-group></article-categories><title-group><article-title>Бесконтактная система измерения волнистости для лазерного деструктурирования металлических поверхностей</article-title><trans-title-group xml:lang="en"><trans-title>Waviness measurement system for implementing in laser destructuring by remelting of metal surfaces</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Орешкин</surname><given-names>О. М.</given-names></name><name name-style="western" xml:lang="en"><surname>Oreshkin</surname><given-names>O. M.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Москва</p></bio><bio xml:lang="en"><p>Oleg M. Oreshkin</p><p>Moscow</p></bio><email xlink:type="simple">olegoreshkin@rambler.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Хлопонин</surname><given-names>В. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Khloponin</surname><given-names>V. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Москва</p></bio><bio xml:lang="en"><p>Viacheslav A. Khloponin</p><p>Moscow</p></bio><email xlink:type="simple">sdniat@gmail.com</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Панов</surname><given-names>Д. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Panov</surname><given-names>D. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Москва</p></bio><bio xml:lang="en"><p>Daniil V. Panov</p><p>Moscow</p></bio><email xlink:type="simple">panovdv96@yandex.ru</email><xref ref-type="aff" rid="aff-3"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ушаков</surname><given-names>Д. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Ushakov</surname><given-names>D. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Москва</p></bio><bio xml:lang="en"><p>Denis V. Ushakov</p><p>Moscow</p></bio><email xlink:type="simple">ushakovd31@gmail.com</email><xref ref-type="aff" rid="aff-3"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Национальный исследовательский ядерный университет «МИФИ»; Научно-техническое объединение «ИРЭ-Полюс»</institution><country>Россия</country></aff><aff xml:lang="en"><institution>National Research Nuclear University MEPhI (Moscow Engineering Physics Institute; Limited Liability Company “Scientifi c and Technical Association “IRE-Polus”</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>Национальный институт авиационных технологий</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Joint Stock Company National Institute of Aviation Technologies</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-3"><aff xml:lang="ru"><institution>Национальный исследовательский ядерный университет «МИФИ»</institution><country>Россия</country></aff><aff xml:lang="en"><institution>National Research Nuclear University MEPhI (Moscow Engineering Physics Institute</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2020</year></pub-date><pub-date pub-type="epub"><day>28</day><month>06</month><year>2023</year></pub-date><volume>0</volume><issue>4</issue><fpage>8</fpage><lpage>13</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; ФГУП "ВНИИФТРИ", 2023</copyright-statement><copyright-year>2023</copyright-year><copyright-holder xml:lang="ru">ФГУП "ВНИИФТРИ"</copyright-holder><copyright-holder xml:lang="en">ФГУП "ВНИИФТРИ"</copyright-holder><license xlink:href="https://www.izmt.ru/jour/about/submissions#copyrightNotice" xlink:type="simple"><license-p>https://www.izmt.ru/jour/about/submissions#copyrightNotice</license-p></license></permissions><self-uri xlink:href="https://www.izmt.ru/jour/article/view/1772">https://www.izmt.ru/jour/article/view/1772</self-uri><abstract><p>Для повышения эффективности технологии лазерного деструктурирования требуются данные о волнистости обрабатываемой детали, связанные с системой координат установки лазерной обработки поверхности. В настоящее время на рынке отсутствуют бесконтактные измерители топографии, соответствующие всем требованиям, которые предъявляются к системе измерения профиля поверхности деталей и определяются параметрами технологического процесса лазерного деструктурирования. Создан опытный образец системы измерения профиля поверхности (волнистости), построенной по принципу оптического профилометра и видоизменённой в соответствии с требованиями к измерениям на установке лазерной обработки. Система позволяет проводить измерения волнистости непосредственно на указанной установке, что значительно снижает трудоёмкость технологического процесса. Описаны схема и принцип работы системы измерения волнистости на установке лазерного деструктурирования. При измерениях использован триангуляционный метод. Опытный образец системы позволяет измерить профиль волнистости поверхности с пространственной длиной волны 2 мм с погрешностью 3,78 мкм в вертикальном направлении и 13,8 мкм в латеральном направлении. Проверка точности опытного образца системы выполнена эталонным методом стилусной профилометрии. Полученный с применением опытного образца системы профиль волнистости поверхности можно использовать для модуляции амплитуды мощности лазерного излучения в технологическом процессе лазерного деструктурирования.</p></abstract><trans-abstract xml:lang="en"><p>To increase the efficiency of laser destructuring, data on the waviness of the part associated with the coordinate system of the laser processing machine are required. At present, there are no non-contact profile measurement systems on the market that meet all the requirements that apply to a system for measuring the surface profile of parts and are determined by the parameters of the laser destructuring. The developed measurement system will allow to take waviness measurement directly at the laser processing machine, which will significantly reduce the complexity of the process. A prototype of a system for measuring the surface profile (waviness) has been created inaccordance with the measurement requirements for a laser processing machine. The scheme and principle of operation of the system for measuring the waviness of the installation for laser destructuring are described. In measurements, the triangulation method was used. A prototype allows to measure the profile of the of the surface waviness with a spatial wavelength of 2 mm with an accuracy of 3,78 μm in the vertical direction and 13,8 μm in the lateral direction. The accuracy of the prototype was verified using the standard method of stylus profilometry. The waviness profile obtained with a developed system can be used to modulate the amplitude of the laser radiation power in the laser destructuring.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>профилометрия</kwd><kwd>измерение волнистости</kwd><kwd>лазерное деструктурирование</kwd><kwd>лазерная обработка</kwd><kwd>оптический профиломер</kwd><kwd>профилограмма</kwd></kwd-group><kwd-group xml:lang="en"><kwd>profilometry</kwd><kwd>waviness measurement</kwd><kwd>waviness reduction</kwd><kwd>laser processing</kwd><kwd>optical profilometer</kwd><kwd>surface profile.</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Oresh kin O., Küpper M., Temmler A., Willenborg E., Journal of Laser Applications, 2015, vol. 27, no. 2. 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