<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.3 20210610//EN" "JATS-journalpublishing1-3.dtd">
<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">izmertech</journal-id><journal-title-group><journal-title xml:lang="ru">Измерительная техника</journal-title><trans-title-group xml:lang="en"><trans-title>Izmeritel`naya Tekhnika</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0368-1025</issn><issn pub-type="epub">2949-5237</issn><publisher><publisher-name>ФГУП "ВНИИФТРИ"</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.32446/0368-1025it.2022-8-35-40</article-id><article-id custom-type="elpub" pub-id-type="custom">izmertech-1639</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ОБЩИЕ ВОПРОСЫ МЕТРОЛОГИИ И ИЗМЕРИТЕЛЬНОЙ ТЕХНИКИ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>GENERAL PROBLEMS OF METROLOGY AND MEASUREMENT TECHNIQUES</subject></subj-group></article-categories><title-group><article-title>Дискретный алгоритм на основе кусочно-линейной интерполяции для дискового морфологического фильтра</article-title><trans-title-group xml:lang="en"><trans-title>Discrete algorithm for disk morphological filter based on piecewise linear interpolation</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0001-6186-6375</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Захаров</surname><given-names>О. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Zakharov</surname><given-names>О. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Олег Владимирович Захаров</p><p>Саратов</p></bio><bio xml:lang="en"><p>Оleg V. Zakharov</p><p>Saratov</p></bio><email xlink:type="simple">zov20@mail.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Лаптев</surname><given-names>А. Г.</given-names></name><name name-style="western" xml:lang="en"><surname>Laptev</surname><given-names>A. G.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Александр Григорьевич Лаптев</p><p>Саратов</p></bio><bio xml:lang="en"><p>Alexander G. Laptev</p><p>Saratov</p></bio><email xlink:type="simple">info@lapic.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Лысенко</surname><given-names>В. Г.</given-names></name><name name-style="western" xml:lang="en"><surname>Lysenko</surname><given-names>V. G.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Валерий Григорьевич Лысенко</p><p>Москва</p></bio><bio xml:lang="en"><p>Valery G. Lysenko</p><p>Moscow</p></bio><email xlink:type="simple">lysenko@vniims.ru</email><xref ref-type="aff" rid="aff-3"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Милованова</surname><given-names>Е. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Milovanova</surname><given-names>E. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Екатерина Александровна Милованова</p><p>Москва</p></bio><bio xml:lang="en"><p>Ekaterina A. Milovanova</p><p>Moscow</p></bio><email xlink:type="simple">milovanova@vniims.ru</email><xref ref-type="aff" rid="aff-3"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Табачникова</surname><given-names>Н. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Tabachnikova</surname><given-names>N. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Наталья Арменаковна Табачникова</p><p>Москва</p></bio><bio xml:lang="en"><p>Natalia A. Tabachnikova</p><p>Moscow</p></bio><email xlink:type="simple">tobachnikova@vniims.ru</email><xref ref-type="aff" rid="aff-3"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Саратовский государственный технический университет им. Ю. А. Гагарина</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Yuri Gagarin State Technical University of Saratov</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>ООО «Лапик»</institution><country>Россия</country></aff><aff xml:lang="en"><institution>LLC “Lapik”</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-3"><aff xml:lang="ru"><institution>Всероссийский научно-исследовательский институт метрологической службы</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Russian Research Institute of Metrological Service</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2022</year></pub-date><pub-date pub-type="epub"><day>22</day><month>05</month><year>2023</year></pub-date><volume>0</volume><issue>8</issue><fpage>35</fpage><lpage>40</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; ФГУП "ВНИИФТРИ", 2023</copyright-statement><copyright-year>2023</copyright-year><copyright-holder xml:lang="ru">ФГУП "ВНИИФТРИ"</copyright-holder><copyright-holder xml:lang="en">ФГУП "ВНИИФТРИ"</copyright-holder><license xlink:href="https://www.izmt.ru/jour/about/submissions#copyrightNotice" xlink:type="simple"><license-p>https://www.izmt.ru/jour/about/submissions#copyrightNotice</license-p></license></permissions><self-uri xlink:href="https://www.izmt.ru/jour/article/view/1639">https://www.izmt.ru/jour/article/view/1639</self-uri><abstract><p>Рассмотрена особенность применения шестиосевых координатно-измерительных машин «Лапик» для измерения шероховатости сложных поверхностей. Данная особенность состоит в неравномерной дискретизации по координатным осям. Для учёта неравномерной дискретизации в качестве элемента прикладного программного обеспечения предложен дискретный алгоритм морфологической фильтрации. В дискретном алгоритме первичный профиль шероховатости подвергался кусочно-линейной интерполяции, дисковый структурный элемент описывался непрерывно, что позволило уменьшить погрешность определения центра дискового элемента при морфологических операциях. Точность алгоритма проверена на реальных и модельных примерах. Полученная погрешность фильтрации при измерении параметров шероховатости составила около 3 %. Проведено сравнение производительностей предложенного, базового дискретного и альфа-формы алгоритмов. Показано преимущество разработанного алгоритма при высокой неравномерности исходных данных. Время фильтрации для 10000 точек профиля шероховатости не превышает 0,05 с.</p></abstract><trans-abstract xml:lang="en"><p>The use of six-axis coordinate measuring machines “Lapik” for measuring the roughness of complex surfaces has a feature that consists in non-uniform discretization along the coordinate axes. One of the elements of the applied software should be a morphological filtering algorithm that takes into account this specificity. Compared to linear and regression Gaussian filters, morphological filters have a number of advantages. The main ones are the absence of edge effects and the not need to first apply a form filter. The well-known basic discrete algorithm for the morphological filter provides for a constant profile discretization step. Another limitation is related to the error from the discretization of the structural element. This article presents a discrete algorithm that takes into account the indicated features of measurement on coordinate measuring machines. To do this, the primary roughness profile is subjected to piecewise linear interpolation, and the disk structural element is described continuously. This makes it possible to determine the center of the disc with less error during morphological operations. Checking the accuracy of the algorithm on real and model examples showed that the filtering error in measuring the parameters Ra and Rqs about 3 %. The advantage of the developed algorithm is realized with a high unevenness of the initial data. The comparison of the performance of the proposed algorithm with the known ones showed its sufficient efficiency. The calculation time for 10000 points of the roughness profile does not exceed 0.05 sec.</p><p> </p></trans-abstract><kwd-group xml:lang="ru"><kwd>шероховатость</kwd><kwd>фильтрация профиля</kwd><kwd>морфологический фильтр</kwd><kwd>дискретный алгоритм</kwd><kwd>кусочно-линейная интерполяция</kwd></kwd-group><kwd-group xml:lang="en"><kwd>roughness</kwd><kwd>profile filtering</kwd><kwd>morphological filter</kwd><kwd>numerical algorithm</kwd><kwd>piecewise linear interpolation</kwd></kwd-group><funding-group><funding-statement xml:lang="ru">работа выполнена при поддержке Российского научного фонда (проект № 22-29-01269)</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">А. с. СССР 1296832 МПК G01B 1/28. Способ контроля формы изделий на координатно-измерительной машине / А. Г. Лаптев, С. Г. Бойченко, В. Д. Семенов, А. Г. Маринин, О. Д. Лосин. Опубл. 15.03.1987. [Patent USSR 1296832 G01B 1/28, Laptev A. G., Boichenko S. G., Semenov V. D., Marinin A. G., Losin O. D., Published 03/15/1987].</mixed-citation><mixed-citation xml:lang="en">А. с. СССР 1296832 МПК G01B 1/28. Способ контроля формы изделий на координатно-измерительной машине / А. Г. Лаптев, С. Г. Бойченко, В. Д. Семенов, А. Г. Маринин, О. Д. Лосин. Опубл. 15.03.1987. [Patent USSR 1296832 G01B 1/28, Laptev A. G., Boichenko S. G., Semenov V. D., Marinin A. G., Losin O. D., Published 03/15/1987].</mixed-citation></citation-alternatives></ref><ref id="cit2"><label>2</label><citation-alternatives><mixed-citation xml:lang="ru">Kochetkov A. V., Troshin A. A., Zakharov O. V., Defect and Diff usion Forum, 2021, vol. 410, pp. 872–877. https://doi.org/10.4028/www.scientifi c.net/DDF.410.872</mixed-citation><mixed-citation xml:lang="en">Kochetkov A. V., Troshin A. A., Zakharov O. V., Defect and Diff usion Forum, 2021, vol. 410, pp. 872–877. https://doi.org/10.4028/www.scientifi c.net/DDF.410.872</mixed-citation></citation-alternatives></ref><ref id="cit3"><label>3</label><citation-alternatives><mixed-citation xml:lang="ru">Lou S., Jiang X., Scott P. J., Measurement, 2013, vol. 46, pp. 993–1001. https://doi.org/10.1016/j.measurement.2012.10.001</mixed-citation><mixed-citation xml:lang="en">Lou S., Jiang X., Scott P. J., Measurement, 2013, vol. 46, pp. 993–1001. https://doi.org/10.1016/j.measurement.2012.10.001</mixed-citation></citation-alternatives></ref><ref id="cit4"><label>4</label><citation-alternatives><mixed-citation xml:lang="ru">Dietzsch M., Gerlach M., Groger S., Wear, 2008, vol. 264, pp. 411–415. https://doi.org/10.1016/j.wear.2006.08.042</mixed-citation><mixed-citation xml:lang="en">Dietzsch M., Gerlach M., Groger S., Wear, 2008, vol. 264, pp. 411–415. https://doi.org/10.1016/j.wear.2006.08.042</mixed-citation></citation-alternatives></ref><ref id="cit5"><label>5</label><citation-alternatives><mixed-citation xml:lang="ru">Lou S., Jiang X., Scott P. J., Journal of Physics: Conference Series, 2014, vol. 483, 012020. https://doi.org/10.1088/1742-6596/483/1/012020</mixed-citation><mixed-citation xml:lang="en">Lou S., Jiang X., Scott P. J., Journal of Physics: Conference Series, 2014, vol. 483, 012020. https://doi.org/10.1088/1742-6596/483/1/012020</mixed-citation></citation-alternatives></ref><ref id="cit6"><label>6</label><citation-alternatives><mixed-citation xml:lang="ru">Podulka P., Metrology and Measurement Systems, 2020, vol. 27, pp. 243–263. https://doi.org/10.24425/mms.2020.132772</mixed-citation><mixed-citation xml:lang="en">Podulka P., Metrology and Measurement Systems, 2020, vol. 27, pp. 243–263. https://doi.org/10.24425/mms.2020.132772</mixed-citation></citation-alternatives></ref><ref id="cit7"><label>7</label><citation-alternatives><mixed-citation xml:lang="ru">Порошин В. В., Богомолов Д. Ю., Лысенко В. Г. Исследование погрешности фильтрации текстуры поверхности пространственным фильтром Гаусса // Измерительная техника. 2017. № 8. С. 19–23. [Poroshin V. V., Bogomolov D. Y., Lysenko V. G., Measurement Techniques, 2017, vol. 60, pp. 777– 784. https://doi.org/10.1007/s11018-017-1270-8].</mixed-citation><mixed-citation xml:lang="en">Порошин В. В., Богомолов Д. Ю., Лысенко В. Г. Исследование погрешности фильтрации текстуры поверхности пространственным фильтром Гаусса // Измерительная техника. 2017. № 8. С. 19–23. [Poroshin V. V., Bogomolov D. Y., Lysenko V. G., Measurement Techniques, 2017, vol. 60, pp. 777– 784. https://doi.org/10.1007/s11018-017-1270-8].</mixed-citation></citation-alternatives></ref><ref id="cit8"><label>8</label><citation-alternatives><mixed-citation xml:lang="ru">Pawlus P., Reizer R., Wieczorowski M., Precision Engineering, 2021, vol. 72, pp. 807–822. https://doi.org/10.1016/j.precisioneng.2021.08.001</mixed-citation><mixed-citation xml:lang="en">Pawlus P., Reizer R., Wieczorowski M., Precision Engineering, 2021, vol. 72, pp. 807–822. https://doi.org/10.1016/j.precisioneng.2021.08.001</mixed-citation></citation-alternatives></ref><ref id="cit9"><label>9</label><citation-alternatives><mixed-citation xml:lang="ru">Bolotov M. A., Pechenin V. A., Murzin S. P., Computer Optics, 2016, vol. 40, pp. 360–369. https://doi.org/10.18287/2412-6179-2016-40-3-360-369</mixed-citation><mixed-citation xml:lang="en">Bolotov M. A., Pechenin V. A., Murzin S. P., Computer Optics, 2016, vol. 40, pp. 360–369. https://doi.org/10.18287/2412-6179-2016-40-3-360-369</mixed-citation></citation-alternatives></ref><ref id="cit10"><label>10</label><citation-alternatives><mixed-citation xml:lang="ru">Leach R. K., Bourell D., Carmignato S., Donmez A., Senin N., Dewulf W., CIRP Annals, 2019, vol. 68, pp. 677–700. https://doi.org/10.1016/j.cirp.2019.05.004</mixed-citation><mixed-citation xml:lang="en">Leach R. K., Bourell D., Carmignato S., Donmez A., Senin N., Dewulf W., CIRP Annals, 2019, vol. 68, pp. 677–700. https://doi.org/10.1016/j.cirp.2019.05.004</mixed-citation></citation-alternatives></ref><ref id="cit11"><label>11</label><citation-alternatives><mixed-citation xml:lang="ru">Okunkova A., Volosova M., Peretyagin P., Zhirnov I., Podrabinnik P., Fedorov S. V., Gusarov A., Advanced Materials Letters, 2016, vol. 7, pp. 111–115. https://doi.org/10.5185/amlett.2016.6143</mixed-citation><mixed-citation xml:lang="en">Okunkova A., Volosova M., Peretyagin P., Zhirnov I., Podrabinnik P., Fedorov S. V., Gusarov A., Advanced Materials Letters, 2016, vol. 7, pp. 111–115. https://doi.org/10.5185/amlett.2016.6143</mixed-citation></citation-alternatives></ref><ref id="cit12"><label>12</label><citation-alternatives><mixed-citation xml:lang="ru">Lou S., Jiang X., Scott P. J., Measurement, 2013, vol. 46. pp. 1002–1008. https://doi.org/10.1016/j.measurement.2012.09.015</mixed-citation><mixed-citation xml:lang="en">Lou S., Jiang X., Scott P. J., Measurement, 2013, vol. 46. pp. 1002–1008. https://doi.org/10.1016/j.measurement.2012.09.015</mixed-citation></citation-alternatives></ref><ref id="cit13"><label>13</label><citation-alternatives><mixed-citation xml:lang="ru">Radhakrishnan V., International Journal of Machine Tool Design and Research, 1972, vol. 12, pp. 151–159. https://doi.org/10.1016/0020-7357(72)90030-3</mixed-citation><mixed-citation xml:lang="en">Radhakrishnan V., International Journal of Machine Tool Design and Research, 1972, vol. 12, pp. 151–159. https://doi.org/10.1016/0020-7357(72)90030-3</mixed-citation></citation-alternatives></ref><ref id="cit14"><label>14</label><citation-alternatives><mixed-citation xml:lang="ru">Srinivasan V., Discrete morphological fi lters for metrology, Proceedings of the sixth IMEKO ISMQC symposium on metrology for quality control in production, TU Wein, Austria, September 8–10, 1998.</mixed-citation><mixed-citation xml:lang="en">Srinivasan V., Discrete morphological fi lters for metrology, Proceedings of the sixth IMEKO ISMQC symposium on metrology for quality control in production, TU Wein, Austria, September 8–10, 1998.</mixed-citation></citation-alternatives></ref><ref id="cit15"><label>15</label><citation-alternatives><mixed-citation xml:lang="ru">Kumar J., Shunmugam M. S., International Journal of Machine Tools and Manufacture, 2006, vol. 46, pp. 260–270. https://doi.org/10.1016/j.ijmachtools.2005.05.025</mixed-citation><mixed-citation xml:lang="en">Kumar J., Shunmugam M. S., International Journal of Machine Tools and Manufacture, 2006, vol. 46, pp. 260–270. https://doi.org/10.1016/j.ijmachtools.2005.05.025</mixed-citation></citation-alternatives></ref><ref id="cit16"><label>16</label><citation-alternatives><mixed-citation xml:lang="ru">Jiang X., Lou S., Scott P. J., Measurement Science and Technology, 2012, vol. 23, 015003. https://doi.org/10.1088/0957-0233/23/1/015003</mixed-citation><mixed-citation xml:lang="en">Jiang X., Lou S., Scott P. J., Measurement Science and Technology, 2012, vol. 23, 015003. https://doi.org/10.1088/0957-0233/23/1/015003</mixed-citation></citation-alternatives></ref><ref id="cit17"><label>17</label><citation-alternatives><mixed-citation xml:lang="ru">Марков Б. Н., Меликова О. Н., Шулепов А. В. Алгоритм построения морфологического дискового фильтра для анализа шероховатости поверхности // Измерительная техника. 2017. № 5. С. 30–33. [Markov B. N., Melikova O. N., Shulepov A. V., Measurement Techniques, 2017, vol. 60, pp. 451–456. https://doi.org/10.1007/s11018-017-1216-1].</mixed-citation><mixed-citation xml:lang="en">Марков Б. Н., Меликова О. Н., Шулепов А. В. Алгоритм построения морфологического дискового фильтра для анализа шероховатости поверхности // Измерительная техника. 2017. № 5. С. 30–33. [Markov B. N., Melikova O. N., Shulepov A. V., Measurement Techniques, 2017, vol. 60, pp. 451–456. https://doi.org/10.1007/s11018-017-1216-1].</mixed-citation></citation-alternatives></ref><ref id="cit18"><label>18</label><citation-alternatives><mixed-citation xml:lang="ru">Лукьянов B. C., Лысенко В. Г. Исследование влияния</mixed-citation><mixed-citation xml:lang="en">Лукьянов B. C., Лысенко В. Г. Исследование влияния</mixed-citation></citation-alternatives></ref><ref id="cit19"><label>19</label><citation-alternatives><mixed-citation xml:lang="ru">аппроксимации на погрешность измерения параметров шероховатости дискретным методом // Измерительная техника. 1982. № 2. C. 16–19. [Luk’yanov V. S., Lysenko V. G., Measurement Techniques, 1982, vol. 25, pp. 106–110. https://doi.org/10.1007/BF00828988].</mixed-citation><mixed-citation xml:lang="en">аппроксимации на погрешность измерения параметров шероховатости дискретным методом // Измерительная техника. 1982. № 2. C. 16–19. [Luk’yanov V. S., Lysenko V. G., Measurement Techniques, 1982, vol. 25, pp. 106–110. https://doi.org/10.1007/BF00828988].</mixed-citation></citation-alternatives></ref><ref id="cit20"><label>20</label><citation-alternatives><mixed-citation xml:lang="ru">Порошин В. В., Богомолов Д. Ю., Порошин О. В., Лысенко В. Г. Применение морфологической пространственной фильтрации неровностей поверхности для трёхмерной параметрической оценки текстуры // Метрология. 2016. № 2. С. 3–14. [Poroshin V. V., Bogomolov D. Y., Poroshin O. V., Lysenko V. G., Measurement Techniques, 2016, vol. 59, pp. 637–643. https://doi.org/10.1007/s11018-016-1023-0].</mixed-citation><mixed-citation xml:lang="en">Порошин В. В., Богомолов Д. Ю., Порошин О. В., Лысенко В. Г. Применение морфологической пространственной фильтрации неровностей поверхности для трёхмерной параметрической оценки текстуры // Метрология. 2016. № 2. С. 3–14. [Poroshin V. V., Bogomolov D. Y., Poroshin O. V., Lysenko V. G., Measurement Techniques, 2016, vol. 59, pp. 637–643. https://doi.org/10.1007/s11018-016-1023-0].</mixed-citation></citation-alternatives></ref><ref id="cit21"><label>21</label><citation-alternatives><mixed-citation xml:lang="ru">Zakharchenko M. Yu., Kochetkov A. V., Salov P. M., Zakharov O. V., Materials Today: Proceedings, 2021, vol. 38, pp. 1866– 1870. https://doi.org/10.1016/j.matpr.2020.08.488</mixed-citation><mixed-citation xml:lang="en">Zakharchenko M. Yu., Kochetkov A. V., Salov P. M., Zakharov O. V., Materials Today: Proceedings, 2021, vol. 38, pp. 1866– 1870. https://doi.org/10.1016/j.matpr.2020.08.488</mixed-citation></citation-alternatives></ref><ref id="cit22"><label>22</label><citation-alternatives><mixed-citation xml:lang="ru">Lou S., Jiang X., Scott P. J., Precision Engineering, 2012, vol. 36, pp. 414–423. https://doi.org/10.1016/j.precisioneng.2012.01.003</mixed-citation><mixed-citation xml:lang="en">Lou S., Jiang X., Scott P. J., Precision Engineering, 2012, vol. 36, pp. 414–423. https://doi.org/10.1016/j.precisioneng.2012.01.003</mixed-citation></citation-alternatives></ref></ref-list><fn-group><fn fn-type="conflict"><p>The authors declare that there are no conflicts of interest present.</p></fn></fn-group></back></article>
