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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">izmertech</journal-id><journal-title-group><journal-title xml:lang="ru">Измерительная техника</journal-title><trans-title-group xml:lang="en"><trans-title>Izmeritel`naya Tekhnika</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0368-1025</issn><issn pub-type="epub">2949-5237</issn><publisher><publisher-name>ФГУП "ВНИИФТРИ"</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">izmertech-1440</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ОПТИКО-ФИЗИЧЕСКИЕ ИЗМЕРЕНИЯ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>OPTICOPHYSICAL MEASUREMENTS</subject></subj-group></article-categories><title-group><article-title>Эталонные средства измерений в оптической интерферометрии высокого разрешения</article-title><trans-title-group xml:lang="en"><trans-title></trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Моисеев</surname><given-names>Н. Н.</given-names></name></name-alternatives><email xlink:type="simple">moiseev@vniiofi.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Золотаревский</surname><given-names>С. Ю.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-2"/></contrib></contrib-group><aff xml:lang="ru" id="aff-1"><institution>Всероссийский научно-исследовательский институт оптико-физических измерений,Москва</institution><country>Russian Federation</country></aff><aff xml:lang="ru" id="aff-2"><institution>Всероссийский научно-исследовательский институт метрологической службы, Москва</institution><country>Russian Federation</country></aff><pub-date pub-type="collection"><year>2012</year></pub-date><pub-date pub-type="epub"><day>07</day><month>02</month><year>2023</year></pub-date><volume>0</volume><issue>8</issue><fpage>35</fpage><lpage>37</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; ФГУП "ВНИИФТРИ", 2023</copyright-statement><copyright-year>2023</copyright-year><copyright-holder xml:lang="ru">ФГУП "ВНИИФТРИ"</copyright-holder><copyright-holder xml:lang="en">ФГУП "ВНИИФТРИ"</copyright-holder><license xlink:href="https://www.izmt.ru/jour/about/submissions#copyrightNotice" xlink:type="simple"><license-p>https://www.izmt.ru/jour/about/submissions#copyrightNotice</license-p></license></permissions><self-uri xlink:href="https://www.izmt.ru/jour/article/view/1440">https://www.izmt.ru/jour/article/view/1440</self-uri><abstract><p>Рассмотрен комплекс эталонных средств измерений в составе набора эталонных мер высоты ступеньки и величины периода, предназначенных для трехмерной калибровки контрольно-измерительного оборудования на основе интерференционных оптических и сканирующих зондовых микроскопов, применяемых для измерения малых расстояний.</p></abstract><trans-abstract xml:lang="en"><p>The complex of standard measuring instruments in composition of a set of standard measures of values of height of step and value of period intended for the three-dimensional calibration of test equipment based on interference optical microscopes and scanning probe microscopes used for measurement of small distances is considered.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>эталонные меры высоты ступеньки</kwd><kwd>калибровка</kwd><kwd>профилометр</kwd><kwd>нанометр</kwd><kwd>step height standard</kwd><kwd>calibration</kwd><kwd>profilometer</kwd><kwd>nanometer</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">ISO/TR 14999-1:2005.Optics and photonics.Interferomotric measurement of optical elements and optical systems. Part 1: Terms, definitions and fundamental relationships.</mixed-citation><mixed-citation xml:lang="en">ISO/TR 14999-1:2005.Optics and photonics.Interferomotric measurement of optical elements and optical systems. Part 1: Terms, definitions and fundamental relationships.</mixed-citation></citation-alternatives></ref><ref id="cit2"><label>2</label><citation-alternatives><mixed-citation xml:lang="ru">ISO/TR 14999-2:2005.Optics and photonics.Interferomotric measurement of optical elements and optical systems. Part 2: Measurement and evaluation techniques.</mixed-citation><mixed-citation xml:lang="en">ISO/TR 14999-2:2005.Optics and photonics.Interferomotric measurement of optical elements and optical systems. Part 2: Measurement and evaluation techniques.</mixed-citation></citation-alternatives></ref><ref id="cit3"><label>3</label><citation-alternatives><mixed-citation xml:lang="ru">ISO/TR 14999-3:2005.Optics and photonics.Interferomotric measurementof optical elements and optical systems. Part 3: Calibration and validation of interferometric test equipment and measurements.</mixed-citation><mixed-citation xml:lang="en">ISO/TR 14999-3:2005.Optics and photonics.Interferomotric measurementof optical elements and optical systems. Part 3: Calibration and validation of interferometric test equipment and measurements.</mixed-citation></citation-alternatives></ref></ref-list><fn-group><fn fn-type="conflict"><p>The authors declare that there are no conflicts of interest present.</p></fn></fn-group></back></article>
