<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.3 20210610//EN" "JATS-journalpublishing1-3.dtd">
<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">izmertech</journal-id><journal-title-group><journal-title xml:lang="ru">Измерительная техника</journal-title><trans-title-group xml:lang="en"><trans-title>Izmeritel`naya Tekhnika</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0368-1025</issn><issn pub-type="epub">2949-5237</issn><publisher><publisher-name>ФГУП "ВНИИФТРИ"</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">izmertech-140</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>РАДИОТЕХНИЧЕСКИЕ ИЗМЕРЕНИЯ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>RADIO MEASUREMENTS</subject></subj-group></article-categories><title-group><article-title>Измерение коэффициента подавления пульсаций линейными стабилизаторми напряжения</article-title><trans-title-group xml:lang="en"><trans-title></trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Битюков</surname><given-names>В. К.</given-names></name></name-alternatives><email xlink:type="simple">bitukov@mirea.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Иванов</surname><given-names>А. А.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Михневич</surname><given-names>Н. Г.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Петров</surname><given-names>В. А.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff xml:lang="ru" id="aff-1"><institution>Московский технологический университет (МИРЭА)</institution><country>Russian Federation</country></aff><pub-date pub-type="collection"><year>2016</year></pub-date><pub-date pub-type="epub"><day>07</day><month>02</month><year>2023</year></pub-date><volume>0</volume><issue>11</issue><fpage>52</fpage><lpage>56</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Битюков В.К., Иванов А.А., Михневич Н.Г., Петров В.А., 2023</copyright-statement><copyright-year>2023</copyright-year><copyright-holder xml:lang="ru">Битюков В.К., Иванов А.А., Михневич Н.Г., Петров В.А.</copyright-holder><copyright-holder xml:lang="en">Битюков В.К., Иванов А.А., Михневич Н.Г., Петров В.А.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://www.izmt.ru/jour/article/view/140">https://www.izmt.ru/jour/article/view/140</self-uri><abstract><p>Исследована возможность измерения частотной зависимости коэффициента подавления пульсаций микросхемами линейных стабилизаторов напряжения с помощью современного осциллографа и генератора без применения специального дорогостоящего оборудования. При различных частотах изучено влияние амплитуды зондирующего синусоидального напряжения на искажение формы выходного сигнала стабилизатора. Рассмотрены вопросы возможного влияния на результаты измерений опций автоматического сканирования, разводки и компоновки платы, а также типов, номиналов и монтажа конденсаторов.</p></abstract><trans-abstract xml:lang="en"><p>Possibility of measuring of frequency dependence of power supply rejection ratio of linear voltage regulators by using just reasonably priced conventional oscilloscope and external function generator without application of expensive special equipment is investigated. Effect of the value of probing voltage at different frequencies on distortion of the form of output signal is studied. The effects of using the automatic scanning options, the layout and assembling of the printed board and the values and types of capacitors are also considered.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>коэффициент подавления пульсаций</kwd><kwd>линейный стабилизатор напряжения</kwd><kwd>микросхема</kwd><kwd>частотная зависимость</kwd><kwd>power supply rejection ratio (PSRR)</kwd><kwd>linear voltage regulator</kwd><kwd>integrated circuit</kwd><kwd>frequency dependence</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Lee B. S. Understanding the Terms and Definitions of LDO Voltage Regulators // Texas Instruments Application Report SLVA079.1999. P. 1-13.</mixed-citation><mixed-citation xml:lang="en">Lee B. S. Understanding the Terms and Definitions of LDO Voltage Regulators // Texas Instruments Application Report SLVA079.1999. P. 1-13.</mixed-citation></citation-alternatives></ref><ref id="cit2"><label>2</label><citation-alternatives><mixed-citation xml:lang="ru">Improved Power-Supply Rejection for Linear Regulators // Maxim Integrated, Application Note. 2002. N. 883. P. 1-7.</mixed-citation><mixed-citation xml:lang="en">Improved Power-Supply Rejection for Linear Regulators // Maxim Integrated, Application Note. 2002. N. 883. P. 1-7.</mixed-citation></citation-alternatives></ref><ref id="cit3"><label>3</label><citation-alternatives><mixed-citation xml:lang="ru">Pithadia S., Lester S. LDO PSRR Measurement Simplified // Texas Instruments Application Report SLAA414. 2009. Р 1-5.</mixed-citation><mixed-citation xml:lang="en">Pithadia S., Lester S. LDO PSRR Measurement Simplified // Texas Instruments Application Report SLAA414. 2009. Р 1-5.</mixed-citation></citation-alternatives></ref><ref id="cit4"><label>4</label><citation-alternatives><mixed-citation xml:lang="ru">Pithadia S. LDO Noise Demystified // Texas Instruments Application Report SLAA412. 2009. P. 1-5.</mixed-citation><mixed-citation xml:lang="en">Pithadia S. LDO Noise Demystified // Texas Instruments Application Report SLAA412. 2009. P. 1-5.</mixed-citation></citation-alternatives></ref><ref id="cit5"><label>5</label><citation-alternatives><mixed-citation xml:lang="ru">ГОСТ 26949-86. Микросхемы интегральные. Методы измерения электрических параметров непрерывных стабилизаторов напряжения.</mixed-citation><mixed-citation xml:lang="en">ГОСТ 26949-86. Микросхемы интегральные. Методы измерения электрических параметров непрерывных стабилизаторов напряжения.</mixed-citation></citation-alternatives></ref><ref id="cit6"><label>6</label><citation-alternatives><mixed-citation xml:lang="ru">LM317L3-Terminal Adjustable Regulator // Texas Instruments SLCS144E-July 2004 - Revised October 2014. P 1-14.</mixed-citation><mixed-citation xml:lang="en">LM317L3-Terminal Adjustable Regulator // Texas Instruments SLCS144E-July 2004 - Revised October 2014. P 1-14.</mixed-citation></citation-alternatives></ref><ref id="cit7"><label>7</label><citation-alternatives><mixed-citation xml:lang="ru">Новаченко И. В., Петухов В. М., Блудов И. П., Юровский А.В. Микросхемы для бытовой радиоаппаратуры: Справочник. М.: КУбК-а, 1996.</mixed-citation><mixed-citation xml:lang="en">Новаченко И. В., Петухов В. М., Блудов И. П., Юровский А.В. Микросхемы для бытовой радиоаппаратуры: Справочник. М.: КУбК-а, 1996.</mixed-citation></citation-alternatives></ref><ref id="cit8"><label>8</label><citation-alternatives><mixed-citation xml:lang="ru">J2120 Line Injector [Офиц. сайт] www.picotest.com (дата обращения: 08.02.2016)</mixed-citation><mixed-citation xml:lang="en">J2120 Line Injector [Офиц. сайт] www.picotest.com (дата обращения: 08.02.2016)</mixed-citation></citation-alternatives></ref><ref id="cit9"><label>9</label><citation-alternatives><mixed-citation xml:lang="ru">Wong K. Demystifying PSRR Specifications for LDOs // How2Power Today, 2013, October Issue. P. 1-11.</mixed-citation><mixed-citation xml:lang="en">Wong K. Demystifying PSRR Specifications for LDOs // How2Power Today, 2013, October Issue. P. 1-11.</mixed-citation></citation-alternatives></ref><ref id="cit10"><label>10</label><citation-alternatives><mixed-citation xml:lang="ru">PSRR and Measurement of PSSR in Class-D Audio Amplifiers and LDOs // Skyworks Solutions, Application Note, September 24, 2012. P. 1-7.</mixed-citation><mixed-citation xml:lang="en">PSRR and Measurement of PSSR in Class-D Audio Amplifiers and LDOs // Skyworks Solutions, Application Note, September 24, 2012. P. 1-7.</mixed-citation></citation-alternatives></ref><ref id="cit11"><label>11</label><citation-alternatives><mixed-citation xml:lang="ru">Keysight Technologies Power Supply Rejection Ratio (PSRR) Measurements Using Keysight InfiniiVision X-series Oscilloscopes // Application Note 5992-0594EN, 2015. P. 1-7.</mixed-citation><mixed-citation xml:lang="en">Keysight Technologies Power Supply Rejection Ratio (PSRR) Measurements Using Keysight InfiniiVision X-series Oscilloscopes // Application Note 5992-0594EN, 2015. P. 1-7.</mixed-citation></citation-alternatives></ref><ref id="cit12"><label>12</label><citation-alternatives><mixed-citation xml:lang="ru">LM317L-N 3-Terminal Adjustable Regulator // Texas Instruments SNVS775J-March 2000 - Revised March 2013. P. 1-16.</mixed-citation><mixed-citation xml:lang="en">LM317L-N 3-Terminal Adjustable Regulator // Texas Instruments SNVS775J-March 2000 - Revised March 2013. P. 1-16.</mixed-citation></citation-alternatives></ref><ref id="cit13"><label>13</label><citation-alternatives><mixed-citation xml:lang="ru">Rice J., Sandler S. Techniques for accurate PSRR measurements // Analog Application Journal. 2013. 4 quarter issue. P. 19-21.</mixed-citation><mixed-citation xml:lang="en">Rice J., Sandler S. Techniques for accurate PSRR measurements // Analog Application Journal. 2013. 4 quarter issue. P. 19-21.</mixed-citation></citation-alternatives></ref><ref id="cit14"><label>14</label><citation-alternatives><mixed-citation xml:lang="ru">LM317 3-Terminal Adjustable Regulator // Texas Instruments SLVS044V-September 1997 - Revised February 2013. P. 1-13.</mixed-citation><mixed-citation xml:lang="en">LM317 3-Terminal Adjustable Regulator // Texas Instruments SLVS044V-September 1997 - Revised February 2013. P. 1-13.</mixed-citation></citation-alternatives></ref><ref id="cit15"><label>15</label><citation-alternatives><mixed-citation xml:lang="ru">Hammerle F., Sandler S. Power Supply Rejection Ratio Measurement Using the Bode 100 and the Picotest J2120 Line Injector // Bode 100 Application Note. 2011. P. 1-9.</mixed-citation><mixed-citation xml:lang="en">Hammerle F., Sandler S. Power Supply Rejection Ratio Measurement Using the Bode 100 and the Picotest J2120 Line Injector // Bode 100 Application Note. 2011. P. 1-9.</mixed-citation></citation-alternatives></ref><ref id="cit16"><label>16</label><citation-alternatives><mixed-citation xml:lang="ru">Sandler S. How do I pick the best voltage regulator for my circuit? // Power Electronics. 2013. Sep. 3. P. 1-9.</mixed-citation><mixed-citation xml:lang="en">Sandler S. How do I pick the best voltage regulator for my circuit? // Power Electronics. 2013. Sep. 3. P. 1-9.</mixed-citation></citation-alternatives></ref></ref-list><fn-group><fn fn-type="conflict"><p>The authors declare that there are no conflicts of interest present.</p></fn></fn-group></back></article>
