<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.3 20210610//EN" "JATS-journalpublishing1-3.dtd">
<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">izmertech</journal-id><journal-title-group><journal-title xml:lang="ru">Измерительная техника</journal-title><trans-title-group xml:lang="en"><trans-title>Izmeritel`naya Tekhnika</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0368-1025</issn><issn pub-type="epub">2949-5237</issn><publisher><publisher-name>ФГУП "ВНИИФТРИ"</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">izmertech-1207</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ЛИНЕЙНЫЕ И УГЛОВЫЕ ИЗМЕРЕНИЯ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>LINEAR AND ANGULAR MEASUREMENTS</subject></subj-group></article-categories><title-group><article-title>Исследование погрешности фильтрации неровностей поверхности сплайновым пространственным фильтром</article-title><trans-title-group xml:lang="en"><trans-title></trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Порошин</surname><given-names>В. В.</given-names></name></name-alternatives><email xlink:type="simple">vporoshin@mail.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Богомолов</surname><given-names>Д. Ю.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Лысенко</surname><given-names>В. Г.</given-names></name></name-alternatives><email xlink:type="simple">lysenko@vniims.ru</email><xref ref-type="aff" rid="aff-2"/></contrib></contrib-group><aff xml:lang="ru" id="aff-1"><institution>Московский государственный индустриальный университет</institution><country>Russian Federation</country></aff><aff xml:lang="ru" id="aff-2"><institution>Всероссийский научно-исследовательский институт метрологической службы</institution><country>Russian Federation</country></aff><pub-date pub-type="collection"><year>2018</year></pub-date><pub-date pub-type="epub"><day>07</day><month>02</month><year>2023</year></pub-date><volume>0</volume><issue>3</issue><fpage>27</fpage><lpage>32</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; ФГУП "ВНИИФТРИ", 2023</copyright-statement><copyright-year>2023</copyright-year><copyright-holder xml:lang="ru">ФГУП "ВНИИФТРИ"</copyright-holder><copyright-holder xml:lang="en">ФГУП "ВНИИФТРИ"</copyright-holder><license xlink:href="https://www.izmt.ru/jour/about/submissions#copyrightNotice" xlink:type="simple"><license-p>https://www.izmt.ru/jour/about/submissions#copyrightNotice</license-p></license></permissions><self-uri xlink:href="https://www.izmt.ru/jour/article/view/1207">https://www.izmt.ru/jour/article/view/1207</self-uri><abstract><p>Описаны результаты алгоритмической и программной реализации международного стандарта ISO 25178-2:2012. Проведён численный анализ погрешностей сплайнового пространственного фильтра в сравнении с результатами пространственного фильтра Гаусса. Определены рекомендуемые параметры фильтра. Алгоритмы и аналитическое программное обеспечение разработаны в ходе исследований отечественной эталонной базы в области пространственной 3D-фильтрации неровностей поверхности.</p></abstract><trans-abstract xml:lang="en"><p>Paper describes the results of the algorithmic and software realization of newly adopted international standard ISO 25178-2:2012. The numerical analysis of spline spatial filter error in comparison with Gaussian spatial filter is performed. The recommended values for filter parameter are defined. Algorithms and analytical software are designed during the research concerning the development of Russian etalon base in the field of spatial 3D filtration of surface texture.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>текстура поверхности</kwd><kwd>пространственная 3D-фильтрация</kwd><kwd>международный стандарт</kwd><kwd>программная реализация</kwd><kwd>surface texture</kwd><kwd>spatial 3D filtration</kwd><kwd>international standard</kwd><kwd>software realization</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Уайтхауз Д. Метрология поверхностей. Принципы, промышленные методы и приборы. М.: Интеллект, 2009.</mixed-citation><mixed-citation xml:lang="en">Уайтхауз Д. Метрология поверхностей. Принципы, промышленные методы и приборы. 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